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Titolo Data di pubblicazione Autore(i) File
Raman microscopy study of pulsed laser ablation deposited silicon carbide films 1-gen-1998 Neri, Fortunato; Trusso, S; Vasi, C; Barreca, Francesco; Valisa, P.
Micro-Raman study of reactive pulsed laser ablation deposited silicon carbon alloy films 1-gen-1998 Trusso, S; Vasi, C; Barreca, Francesco; Neri, Fortunato
Correlation of structural and electrical transport properties in hydrogenated silicon films 1-gen-2000 Barreca, Francesco; Fazio, Enza; Neri, Fortunato; S., Trusso; C., Vasi
Measurement of the dielectric constant of amorphous CNx films in the 0-45 eV energy range 1-gen-2000 Barreca, Francesco; Mezzasalma, Angela Maria; Mondio, Guglielmo; Neri, Fortunato; Trusso, S; Vasi, C.
Optical constants of CNx thin films from reflection electron energy loss spectroscopy 1-gen-2000 Barreca, Francesco; Mezzasalma, Angela Maria; Mondio, Guglielmo; Neri, Fortunato; Trusso, S; Vasi, C.
Pulsed laser deposition of silicon and carbon based thin films 1-gen-2001 Barreca, Francesco; Fazio, Enza; Neri, Fortunato; Trusso, S.; Vasi, C.
Optical constants from reflection electro energy loss spectroscopy: theory and applications 1-gen-2001 Trusso, S.; Mondio, Guglielmo; Mezzasalma, Angela Maria; Neri, Fortunato; Barreca, Francesco
Characterization of pulsed laser deposited a-C films by means of reflection electron energy loss spectroscopy 1-gen-2001 BARRECA F.; MEZZASALMA AM; MONDIO G; NERI F; TRUSSO S
Influence of low level nitrogenation on the structural properties of pulsed laser ablation deposited a-CNx films 1-gen-2002 Fazio, Enza; Barreca, Francesco; Neri, Fortunato; Trusso, S.
Excimer laser ablation of silicon carbide ceramic targets 1-gen-2002 Neri, Fortunato; Barreca, Francesco; Trusso, S.
Bonding configurations and optical band gap for nitrogenated amorphous silicon carbide films prepared by pulsed laser ablation 1-gen-2002 TRUSSO S; BARRECA F.; NERI F
Raman and infrared study of PLD deposited SiOx thin films 1-gen-2003 Fazio, Enza; Barreca, Francesco; E., Barletta; Neri, Fortunato; S., Trusso
Electronic properties of PLD prepared nitrogenated a-SiC thin films 1-gen-2003 BARRECA F; FAZIO E; NERI F.; TRUSSO S
Optical emission spectroscopy study of the plasma plume produced by laser ablation of SiC in a nitrogen atmosphere 1-gen-2003 S., Trusso; Neri, Fortunato; E., Barletta; Barreca, Francesco
Time resolved imaging studies of the plasma produced by laser ablation of silicon in O2/Ar atmosphere 1-gen-2004 Fazio, Enza; Barreca, Francesco; E., Barletta; Neri, Fortunato; S., Trusso
Effects of deposition parameters on PLA prepared thin SiC films 1-gen-2004 Barreca, Francesco; E., Barletta; Fazio, Enza; Neri, Fortunato; S., Trusso
Pulsed laser ablation of SiC in a nitrogen atmosphere: formation of CN 1-gen-2004 Trusso, S; Barletta, E; Barreca, Francesco; Neri, Fortunato
Spectroscopic investigation of the structural properties of Si1-xCx thin films 1-gen-2005 Fazio, Enza; Barreca, Francesco; M., Latino; Neri, Fortunato; S., Trusso
Investigation of a nanocrystalline silicon phase embedded in SiOx thin films grown by pulsed laser deposition 1-gen-2005 FAZIO E; BARLETTA E; BARRECA F; NERI F.; TRUSSO S
Dynamics of a pulsed laser generated tin plasma expanding in an oxygen atmosphere 1-gen-2005 Barreca, Francesco; Fazio, Enza; Neri, Fortunato; E., Barletta; S., Trusso; B., Fazio
Mostrati risultati da 1 a 20 di 75
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