Sfoglia per Autore  

Opzioni
Mostrati risultati da 1 a 20 di 162
Titolo Data di pubblicazione Autore(i) File
New Measurement Method of MOS Transistor Parameters 1-gen-1990 Ciofi, Carmine; Macucci, M.; Pellegrini, B.
Pulsed laser deposition and characterization of superconducting Ba1-xKxBiO3 thin films 1-gen-1992 PLATT C., E; TEEPE M., R; Ciofi, Carmine; Zhang, H; Dravid, P; Schweinfurth, A; VAN HARLINGEN D., J; EADES J., A; LIN C., H; Strothers, D; Hammond, R.
LOW-FREQUENCY ELECTROMIGRATION NOISE AND FILM MICROSTRUCTURE IN AL/SI STRIPES - ELECTRICAL MEASUREMENTS AND TEM ANALYSIS 1-gen-1993 Ciofi, Carmine; Diligenti, A; Giacomozzi, F; Nannini, A; Neri, B.
STRUCTURAL COMPARISON OF BA1-XKXBIO3 SUPERCONDUCTING THIN-FILMS 1-gen-1994 Ciofi, Carmine; Platt, Ce; Eades, Ja; Amano, J; Hu, R.
DEPENDENCE OF ELECTROMIGRATION NOISE ON GEOMETRICAL AND STRUCTURAL CHARACTERISTICS IN ALUMINUM-BASED RESISTORS 1-gen-1994 Chicca, S; Ciofi, Carmine; Diligenti, A; Nannini, A; Neri, B.
Electromigration in Al Based Stripes: Low Frequency Noise Measurements and MTF Test 1-gen-1995 Bagnoli, P. E.; Ciofi, Carmine; Neri, B.; Pennelli, G.
Voltage and Current Sources for Ultra Low Noise Measurement Systems 1-gen-1995 Ciofi, Carmine; DE MARINIS, M; Neri, B.
CHARACTERIZATION OF YSZ FILMS BY MEANS OF C-V MEASUREMENTS AND TEM OBSERVATIONS 1-gen-1995 Bagnoli, Pe; Ciofi, Carmine; Diligenti, A; Innamorato, A; Nannini, A.
Copper Interconnection Lines: SARF characterization and Lifetime Test 1-gen-1996 Ciofi, Carmine; Dattilo, V.; Neri, B.
Wafer Level Measurement System for SARF Characterization of Metal Lines 1-gen-1996 Ciofi, Carmine; DE MARINIS, M.; Neri, B.
Ultra Low Noise, PC-Based Measurement System for the Characterization of the Metallizations of Integrated Circuits 1-gen-1996 Ciofi, Carmine; DE MARINIS, M; Neri, B.
High Precision, Integrable, Static Memory for Analog Signals 1-gen-1996 Ciofi, Carmine
Photoluminescence from ion-beam cosputtered Si/SiO2 thin films 1-gen-1996 Allegrini, M; Ciofi, Carmine; Diligenti, A; Fuso, F; Nannini, A; Pellegrini, V; Pennelli, G.
Comments on the Utilization of Noise Measurements for the Characterization of Electromigration in Metal Lines 1-gen-1997 Ciofi, Carmine; Dattilo, V.; Neri, B.
Temperature Coefficient of Resistance Fluctuations During Electromigration in Al lines 1-gen-1997 Ciofi, Carmine; DI PASCOLI, S.
Ultra low noise current sources 1-gen-1997 Ciofi, Carmine; Giannetti, R; Dattilo, V; Neri, B.
Characterization of Al-Si-Cu Metal Lines by means of TEM Analysis and the SARF technique 1-gen-1997 Ciofi, Carmine; Franzese, M.; Neri, B.
Ultralow-noise programmable voltage source 1-gen-1997 Baracchino, L; Basso, G; Ciofi, Carmine; Neri, B.
Ultralow-noise PC-based measurement system for the characterization of the metallizations of integrated circuits 1-gen-1997 Ciofi, Carmine; Demarinis, M; Neri, B.
Noise and fluctuations in submicrometric Al-Si interconnect lines 1-gen-1997 Neri, B; Ciofi, Carmine; Dattilo, V.
Mostrati risultati da 1 a 20 di 162
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile