Sfoglia per Autore
A new technique for extracting the MOSFET threshold voltage using noise measurements
2004-01-01 Giusi, Gino; Donato, Nicola; Ciofi, Carmine; Crupi, F.
Design and realization of high accuracy SAM (static analog memories) using low cost DA converters
2004-01-01 Scandurra, Graziella; Ciofi, Carmine; G., Cannatà; Giusi, Gino
Long term stability estimation of DC electrical source from low frequency noise measurements
2004-01-01 G. Giusi;G. Scandurra;C. Ciofi;C. Pace
Dedicated instrumentation for high sensitivity, low frequency noise measurement systems
2004-01-01 CIOFI; GIUSI G; SCANDURRA G; NERI B
A novel ultra sensitive method for voltage noise measurements
2005-01-01 F., Crupi; Giusi, Gino; Ciofi, Carmine; C., Pace
Low-frequency (1/f) noise behavior of locally stressed HfO2/TiN gate-stack pMOSFETs
2006-01-01 Giusi, Gino; Simoen, E; Eneman, G; Verheyen, P; Crupi, F; DE MEYER, K; Claeys, C; Ciofi,
Design and Realization of High-Accuracy Static Analog Memories (SAMs) Using Low-Cost DA Converters
2006-01-01 Scandurra, Graziella; Ciofi, Carmine; Giusi, Gino; Castano, M; Cannata', Gianluca
Low-frequency (1/f) noise behavior of locally stressed HfO2/ TiN gate-stack pMOSFETs
2006-01-01 Giusi, Gino; E., Simoen; G. c., D; P., Verheyen; F., Crupi; K. c., De; C. c., Claeys; Ciofi, Carmine
Instrumentation design for gate and drain low frequency noise measurements
2006-01-01 Giusi, Gino; F., Crupi; Ciofi, Carmine; C., Pace
Enhanced sensitivity cross-correlation method for voltage noise measurements
2006-01-01 F., Crupi; Giusi, Gino; Ciofi, Carmine; C., Pace
Ultrasensitive method for current noise measurements
2006-01-01 GIUSI G; CRUPI F; CIOFI; PACE C
Dedicated instrumentation for single-electron effects detection in Si nanocrystal memories
2006-01-01 C. b. Pace;F. b. Crupi;S. Lombardo;G. Giusi
Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics
2006-01-01 GIUSI G; CRUPI F; PACE C; CIOFI; GROESENEKEN G
Three-channel amplifier for high-sensitivity voltage noise measurements
2006-01-01 GIUSI, Gino; CRUPI, Felice; CIOFI, Carmine; PACE, Calogero
A procedure for extracting 1/f noise from random telegraph signals
2007-01-01 Giusi, Gino; F., Crupi; C., Pace
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics
2007-01-01 P., Magnone; C. b., Pace; F. b., Crupi; Giusi, Gino
Four channels cross correlation method for high sensitivity current noise measurements
2007-01-01 C. Ciofi;G. Scandurra;R. Merlino;G. Cannatà;G. Giusi
Two-channel amplifier for high-sensitivity voltage noise measurements
2007-01-01 F., Crupi; Giusi, Gino; C., Pace
A new correlation method for high sensitivity current noise measurements.
2007-01-01 Ciofi, Carmine; Scandurra, Graziella; Merlino, R; Cannata', Gianluca; Giusi, Gino
Does strain engineering impact the gate stack quality and reliability?
2007-01-01 C., Claeys; E., Simoen; Giusi, Gino; F., Crupi
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