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Mostrati risultati da 1 a 20 di 93
Titolo Data di pubblicazione Autore(i) File
A new technique for extracting the MOSFET threshold voltage using noise measurements 1-gen-2004 Giusi, Gino; Donato, Nicola; Ciofi, Carmine; Crupi, F.
Design and realization of high accuracy SAM (static analog memories) using low cost DA converters 1-gen-2004 Scandurra, Graziella; Ciofi, Carmine; G., Cannatà; Giusi, Gino
Long term stability estimation of DC electrical source from low frequency noise measurements 1-gen-2004 G. Giusi;G. Scandurra;C. Ciofi;C. Pace
Dedicated instrumentation for high sensitivity, low frequency noise measurement systems 1-gen-2004 CIOFI; GIUSI G; SCANDURRA G; NERI B
A novel ultra sensitive method for voltage noise measurements 1-gen-2005 F., Crupi; Giusi, Gino; Ciofi, Carmine; C., Pace
Low-frequency (1/f) noise behavior of locally stressed HfO2/TiN gate-stack pMOSFETs 1-gen-2006 Giusi, Gino; Simoen, E; Eneman, G; Verheyen, P; Crupi, F; DE MEYER, K; Claeys, C; Ciofi,
Design and Realization of High-Accuracy Static Analog Memories (SAMs) Using Low-Cost DA Converters 1-gen-2006 Scandurra, Graziella; Ciofi, Carmine; Giusi, Gino; Castano, M; Cannata', Gianluca
Low-frequency (1/f) noise behavior of locally stressed HfO2/ TiN gate-stack pMOSFETs 1-gen-2006 Giusi, Gino; E., Simoen; G. c., D; P., Verheyen; F., Crupi; K. c., De; C. c., Claeys; Ciofi, Carmine
Instrumentation design for gate and drain low frequency noise measurements 1-gen-2006 Giusi, Gino; F., Crupi; Ciofi, Carmine; C., Pace
Enhanced sensitivity cross-correlation method for voltage noise measurements 1-gen-2006 F., Crupi; Giusi, Gino; Ciofi, Carmine; C., Pace
Ultrasensitive method for current noise measurements 1-gen-2006 GIUSI G; CRUPI F; CIOFI; PACE C
Dedicated instrumentation for single-electron effects detection in Si nanocrystal memories 1-gen-2006 C. b. Pace;F. b. Crupi;S. Lombardo;G. Giusi
Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics 1-gen-2006 GIUSI G; CRUPI F; PACE C; CIOFI; GROESENEKEN G
Three-channel amplifier for high-sensitivity voltage noise measurements 1-gen-2006 GIUSI, Gino; CRUPI, Felice; CIOFI, Carmine; PACE, Calogero
A procedure for extracting 1/f noise from random telegraph signals 1-gen-2007 Giusi, Gino; F., Crupi; C., Pace
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics 1-gen-2007 P., Magnone; C. b., Pace; F. b., Crupi; Giusi, Gino
Four channels cross correlation method for high sensitivity current noise measurements 1-gen-2007 C. Ciofi;G. Scandurra;R. Merlino;G. Cannatà;G. Giusi
Two-channel amplifier for high-sensitivity voltage noise measurements 1-gen-2007 F., Crupi; Giusi, Gino; C., Pace
A new correlation method for high sensitivity current noise measurements. 1-gen-2007 Ciofi, Carmine; Scandurra, Graziella; Merlino, R; Cannata', Gianluca; Giusi, Gino
Does strain engineering impact the gate stack quality and reliability? 1-gen-2007 C., Claeys; E., Simoen; Giusi, Gino; F., Crupi
Mostrati risultati da 1 a 20 di 93
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