Sfoglia per Autore
New Measurement Method of MOS Transistor Parameters
1990-01-01 Ciofi, Carmine; Macucci, M.; Pellegrini, B.
Pulsed laser deposition and characterization of superconducting Ba1-xKxBiO3 thin films
1992-01-01 PLATT C., E; TEEPE M., R; Ciofi, Carmine; Zhang, H; Dravid, P; Schweinfurth, A; VAN HARLINGEN D., J; EADES J., A; LIN C., H; Strothers, D; Hammond, R.
LOW-FREQUENCY ELECTROMIGRATION NOISE AND FILM MICROSTRUCTURE IN AL/SI STRIPES - ELECTRICAL MEASUREMENTS AND TEM ANALYSIS
1993-01-01 Ciofi, Carmine; Diligenti, A; Giacomozzi, F; Nannini, A; Neri, B.
DEPENDENCE OF ELECTROMIGRATION NOISE ON GEOMETRICAL AND STRUCTURAL CHARACTERISTICS IN ALUMINUM-BASED RESISTORS
1994-01-01 Chicca, S; Ciofi, Carmine; Diligenti, A; Nannini, A; Neri, B.
STRUCTURAL COMPARISON OF BA1-XKXBIO3 SUPERCONDUCTING THIN-FILMS
1994-01-01 Ciofi, Carmine; Platt, Ce; Eades, Ja; Amano, J; Hu, R.
Electromigration in Al Based Stripes: Low Frequency Noise Measurements and MTF Test
1995-01-01 Bagnoli, P. E.; Ciofi, Carmine; Neri, B.; Pennelli, G.
Voltage and Current Sources for Ultra Low Noise Measurement Systems
1995-01-01 Ciofi, Carmine; DE MARINIS, M; Neri, B.
CHARACTERIZATION OF YSZ FILMS BY MEANS OF C-V MEASUREMENTS AND TEM OBSERVATIONS
1995-01-01 Bagnoli, Pe; Ciofi, Carmine; Diligenti, A; Innamorato, A; Nannini, A.
Ultra Low Noise, PC-Based Measurement System for the Characterization of the Metallizations of Integrated Circuits
1996-01-01 Ciofi, Carmine; DE MARINIS, M; Neri, B.
Wafer Level Measurement System for SARF Characterization of Metal Lines
1996-01-01 Ciofi, Carmine; DE MARINIS, M.; Neri, B.
Copper Interconnection Lines: SARF characterization and Lifetime Test
1996-01-01 Ciofi, Carmine; Dattilo, V.; Neri, B.
High Precision, Integrable, Static Memory for Analog Signals
1996-01-01 Ciofi, Carmine
Photoluminescence from ion-beam cosputtered Si/SiO2 thin films
1996-01-01 Allegrini, M; Ciofi, Carmine; Diligenti, A; Fuso, F; Nannini, A; Pellegrini, V; Pennelli, G.
Ultra low noise current sources
1997-01-01 Ciofi, Carmine; Giannetti, R; Dattilo, V; Neri, B.
Comments on the Utilization of Noise Measurements for the Characterization of Electromigration in Metal Lines
1997-01-01 Ciofi, Carmine; Dattilo, V.; Neri, B.
Temperature Coefficient of Resistance Fluctuations During Electromigration in Al lines
1997-01-01 Ciofi, Carmine; DI PASCOLI, S.
Characterization of Al-Si-Cu Metal Lines by means of TEM Analysis and the SARF technique
1997-01-01 Ciofi, Carmine; Franzese, M.; Neri, B.
Ultra low noise measurement systems
1997-01-01 Ciofi, Carmine; Dattilo, V; Neri, B.
Ultralow-noise programmable voltage source
1997-01-01 Baracchino, L; Basso, G; Ciofi, Carmine; Neri, B.
Ultralow-noise PC-based measurement system for the characterization of the metallizations of integrated circuits
1997-01-01 Ciofi, Carmine; Demarinis, M; Neri, B.
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