Sfoglia per Autore
Ultralow-noise programmable voltage source
1997-01-01 Baracchino, L; Basso, G; Ciofi, Carmine; Neri, B.
Copper metallizations for integrated circuits: TEM analysis and electrical characterization
1997-01-01 Bruschi, P; Ciofi, Carmine; Dattilo, V; Diligenti, A; Nannini, A; Neri, B.
Pulsed laser deposition and characterization of conductive RuO2 thin films
1997-01-01 Iembo, A; Fuso, F; Arimondo, E; Ciofi, Carmine; Pennelli, G; Curro, Gm; Neri, Fortunato; Allegrini, M.
N,N-dialkylcarbamato complexes as precursors for the chemical implantation of metal cations on a silica support, Part 2, Platinum(II) and its further reduction to platinum nanoparticles
1998-01-01 Abis, L.; Dell'Amico, D. B.; Busetto, C.; Calderazzo, F.; Caminiti, R.; Ciofi, Carmine; Garbassi, F.; Masciarelli, M.
Temperature controlled multi oven for MTF tests
1998-01-01 Ciofi, Carmine; Giannetti, R; Neri, B.
Ultra Low noise, current to voltage converter with offset compensation independent of the source impedance
1998-01-01 Ciofi, Carmine; Festa, G; Giannetti, R; Neri, B.
Ultra low-noise current sources
1998-01-01 Ciofi, Carmine; Giannetti, R; Dattilo, V; Neri, B.
Platinum nanoparticles on silica obtained under mild conditions using cis-PtCl2(CO)(2) as precursor
1998-01-01 Dell'Amico, Db; Calderazzo, F; Ciofi, Carmine; Garbassi, F; Grande, L; Masciarelli, G.
True constant temperature measurement system for lifetime tests of metallic interconnections of IC's
1998-01-01 Ciofi, Carmine; Giannetti, R; Neri, B.
Long Term Noise Measurements to Characterize Electromigration in Metal Lines of ICs
1999-01-01 Ciofi, Carmine; Dattilo, V.; Neri, B.; Foley, S.; Mathewson, A.
Open Questions on Noise in Metal Lines Subjected to High Current Densities
1999-01-01 Ciofi, Carmine; Dattilo, V.; Neri, B.
Temperature controlled Oven for Low Noise Measurement Systems
1999-01-01 Ciofi, Carmine; Ciofi, I.; DI PASCOLI, S.; Neri, B.
Long term noise measurements and median time to failure test for the characterization of electromigration in metal lines
1999-01-01 Ciofi, Carmine; Dattilo, V; Neri, B; Foley, S; Mathewson, A.
Simulation and measurement of shot noise in resonant tunneling structures
2000-01-01 Iannaccone, G; Lombardi, G; Macucci, M; Ciofi, Carmine; Pellegrini, B.
Low frequency noise evolution during lifetime tests of lines and vias subjected to electromigration
2000-01-01 Dattilo, V; Neri, B; Ciofi, Carmine
Low-frequency noise measurements as a characterization tool for degradation phenomena in solid-state devices
2000-01-01 Ciofi, Carmine; Neri, B.
Temperature controlled oven for low noise measurement systems
2000-01-01 Ciofi, Carmine; Ciofi, I; DI PASCOLI, S; Neri, B.
Short noise partial suppression in the SILC regime
2000-01-01 Crupi, F; Iannaccone, G; Neri, B; Ciofi, Carmine; Lombardo, S.
Noise as a probe of the charge transport mechanisms through thin oxides in MOS structures
2001-01-01 Crupi, F.; Ciofi, Carmine; Pace, C.; Iannaccone, G.; Neri, B.
A New Method for High Sensitivity Noise Measurements
2001-01-01 Ciofi, Carmine; Crupi, Felice; Pace, Calogero
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