Sfoglia per Autore
AC CONDUCTIVITY OF REACTIVE-EVAPORATION DEPOSITED A-SI-H FILMS
1991-01-01 GRASSO V; NERI F.; TRUSSO S
THE DIELECTRIC-CONSTANT OF PD-NI ALLOYS
1992-01-01 Mondio, Guglielmo; Neri, Fortunato; Curro, G; Duo, L; Wandelt, K.
OPTICAL-PROPERTIES FROM REFLECTION ELECTRON-ENERGY LOSS SPECTROSCOPY
1992-01-01 Mondio, Guglielmo; Neri, Fortunato; Patane', Salvatore; Arena, Antonella; Marletta, G; Iacona, F.
FREQUENCY-DEPENDENT CONDUCTIVITY IN BORON-DOPED AND PHOSPHORUS- DOPED AMORPHOUS-SILICON FILMS
1992-01-01 Grasso, Vincenzo; Giorgianni, U; Neri, Fortunato; Trusso, S.
ENERGY-LOSS MEASUREMENTS AND ELECTRONIC-PROPERTIES OF THIANTHREN
1992-01-01 Arena, Antonella; Girlanda, Raffaello; Martino, Giovanna; Neri, Fortunato; Saitta, Gaetano
THE DIELECTRIC-CONSTANT OF TCNQ SINGLE-CRYSTALS AS DEDUCED BY REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
1993-01-01 Mondio, Guglielmo; Neri, Fortunato; Curro, G; Patane', Salvatore; Compagnini, G.
TEMPERATURE-DEPENDENCE OF THE MNPS3 CRYSTAL FLUORESCENCE
1993-01-01 Grasso, Vincenzo; Neri, Fortunato; Perillo, Paolo; Silipigni, Letteria
AMORPHOUS SILICON-CARBON FILMS PREPARED BY REACTIVE EVAPORATION
1993-01-01 Giorgianni, U; Grasso, Vincenzo; Nardi, N; Neri, Fortunato; Trusso, S.
ELECTRICAL-CONDUCTIVITY OF LITHIUM-INTERCALATED THIOPHOSPHATE NIPS3 SINGLE-CRYSTALS
1994-01-01 Giunta, G; Grasso, Vincenzo; Neri, Fortunato; Silipigni, Letteria
OPTICAL-CONSTANTS OF HYDROGENATED AMORPHOUS-CARBON IN THE RANGE 0-100 EV
1994-01-01 Curro, G; Neri, Fortunato; Mondio, Guglielmo; Compagnini, G; Foti, G.
THE EFFECTS OF THE LITHIUM INTERCALATION ON THE X-RAY PHOTOELECTRON-SPECTRA OF NIPS3
1995-01-01 Curro, Gm; Grasso, Vincenzo; Neri, Fortunato; Silipigni, Letteria
ELECTRONIC-PROPERTIES OF ION-IMPLANTED HYDROGENATED AMORPHOUS- CARBON
1995-01-01 CURRO G; MONDIO G.; NERI F; FOTI G; COMPAGNINI G
Effects of lithium intercalation on the electronic properties of FePS3 single crystals
1996-01-01 Silipigni, Letteria; Calareso, C; Curro, Gm; Neri, Fortunato; Grasso, Vincenzo; Berger, H; Margaritondo, G; Ponterio, R.
Pulsed laser ablation and deposition of PZT-based multilayer
1997-01-01 Fuso, F; Ceresara, L; Iembo, A; Arimondo, E; Neri, Fortunato; Mondio, Guglielmo; Allegrini, M.
Energy loss spectroscopy of RuO2 thin films
1997-01-01 Mondio, Guglielmo; Neri, Fortunato; Allegrini, M.
The low-energy absorption and reflectivity of Hg2P2S6 and Hg2P2Se6
1997-01-01 CALARESO C; GRASSO V; NERI F.; SILIPIGNI L
Pulsed laser deposition and characterization of conductive RuO2 thin films
1997-01-01 Iembo, A; Fuso, F; Arimondo, E; Ciofi, Carmine; Pennelli, G; Curro, Gm; Neri, Fortunato; Allegrini, M.
Particle sizing with a simple differential light-scattering photometer: Homogeneous spherical particles
1997-01-01 Grasso, Vincenzo; Neri, Fortunato; Fucile, E.
Differential light-scattering photometer using a CCD camera
1998-01-01 Neri, Fortunato; Pizzi, P; Romeo, G; Saija, Rosalba
Raman microscopy study of pulsed laser ablation deposited silicon carbide films
1998-01-01 Neri, Fortunato; Trusso, S; Vasi, C; Barreca, Francesco; Valisa, P.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
AC CONDUCTIVITY OF REACTIVE-EVAPORATION DEPOSITED A-SI-H FILMS | 1-gen-1991 | GRASSO V; NERI F.; TRUSSO S | |
THE DIELECTRIC-CONSTANT OF PD-NI ALLOYS | 1-gen-1992 | Mondio, Guglielmo; Neri, Fortunato; Curro, G; Duo, L; Wandelt, K. | |
OPTICAL-PROPERTIES FROM REFLECTION ELECTRON-ENERGY LOSS SPECTROSCOPY | 1-gen-1992 | Mondio, Guglielmo; Neri, Fortunato; Patane', Salvatore; Arena, Antonella; Marletta, G; Iacona, F. | |
FREQUENCY-DEPENDENT CONDUCTIVITY IN BORON-DOPED AND PHOSPHORUS- DOPED AMORPHOUS-SILICON FILMS | 1-gen-1992 | Grasso, Vincenzo; Giorgianni, U; Neri, Fortunato; Trusso, S. | |
ENERGY-LOSS MEASUREMENTS AND ELECTRONIC-PROPERTIES OF THIANTHREN | 1-gen-1992 | Arena, Antonella; Girlanda, Raffaello; Martino, Giovanna; Neri, Fortunato; Saitta, Gaetano | |
THE DIELECTRIC-CONSTANT OF TCNQ SINGLE-CRYSTALS AS DEDUCED BY REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY | 1-gen-1993 | Mondio, Guglielmo; Neri, Fortunato; Curro, G; Patane', Salvatore; Compagnini, G. | |
TEMPERATURE-DEPENDENCE OF THE MNPS3 CRYSTAL FLUORESCENCE | 1-gen-1993 | Grasso, Vincenzo; Neri, Fortunato; Perillo, Paolo; Silipigni, Letteria | |
AMORPHOUS SILICON-CARBON FILMS PREPARED BY REACTIVE EVAPORATION | 1-gen-1993 | Giorgianni, U; Grasso, Vincenzo; Nardi, N; Neri, Fortunato; Trusso, S. | |
ELECTRICAL-CONDUCTIVITY OF LITHIUM-INTERCALATED THIOPHOSPHATE NIPS3 SINGLE-CRYSTALS | 1-gen-1994 | Giunta, G; Grasso, Vincenzo; Neri, Fortunato; Silipigni, Letteria | |
OPTICAL-CONSTANTS OF HYDROGENATED AMORPHOUS-CARBON IN THE RANGE 0-100 EV | 1-gen-1994 | Curro, G; Neri, Fortunato; Mondio, Guglielmo; Compagnini, G; Foti, G. | |
THE EFFECTS OF THE LITHIUM INTERCALATION ON THE X-RAY PHOTOELECTRON-SPECTRA OF NIPS3 | 1-gen-1995 | Curro, Gm; Grasso, Vincenzo; Neri, Fortunato; Silipigni, Letteria | |
ELECTRONIC-PROPERTIES OF ION-IMPLANTED HYDROGENATED AMORPHOUS- CARBON | 1-gen-1995 | CURRO G; MONDIO G.; NERI F; FOTI G; COMPAGNINI G | |
Effects of lithium intercalation on the electronic properties of FePS3 single crystals | 1-gen-1996 | Silipigni, Letteria; Calareso, C; Curro, Gm; Neri, Fortunato; Grasso, Vincenzo; Berger, H; Margaritondo, G; Ponterio, R. | |
Pulsed laser ablation and deposition of PZT-based multilayer | 1-gen-1997 | Fuso, F; Ceresara, L; Iembo, A; Arimondo, E; Neri, Fortunato; Mondio, Guglielmo; Allegrini, M. | |
Energy loss spectroscopy of RuO2 thin films | 1-gen-1997 | Mondio, Guglielmo; Neri, Fortunato; Allegrini, M. | |
The low-energy absorption and reflectivity of Hg2P2S6 and Hg2P2Se6 | 1-gen-1997 | CALARESO C; GRASSO V; NERI F.; SILIPIGNI L | |
Pulsed laser deposition and characterization of conductive RuO2 thin films | 1-gen-1997 | Iembo, A; Fuso, F; Arimondo, E; Ciofi, Carmine; Pennelli, G; Curro, Gm; Neri, Fortunato; Allegrini, M. | |
Particle sizing with a simple differential light-scattering photometer: Homogeneous spherical particles | 1-gen-1997 | Grasso, Vincenzo; Neri, Fortunato; Fucile, E. | |
Differential light-scattering photometer using a CCD camera | 1-gen-1998 | Neri, Fortunato; Pizzi, P; Romeo, G; Saija, Rosalba | |
Raman microscopy study of pulsed laser ablation deposited silicon carbide films | 1-gen-1998 | Neri, Fortunato; Trusso, S; Vasi, C; Barreca, Francesco; Valisa, P. |
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