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Titolo Data di pubblicazione Autore(i) File
AC CONDUCTIVITY OF REACTIVE-EVAPORATION DEPOSITED A-SI-H FILMS 1-gen-1991 GRASSO V; NERI F.; TRUSSO S
THE DIELECTRIC-CONSTANT OF PD-NI ALLOYS 1-gen-1992 Mondio, Guglielmo; Neri, Fortunato; Curro, G; Duo, L; Wandelt, K.
OPTICAL-PROPERTIES FROM REFLECTION ELECTRON-ENERGY LOSS SPECTROSCOPY 1-gen-1992 Mondio, Guglielmo; Neri, Fortunato; Patane', Salvatore; Arena, Antonella; Marletta, G; Iacona, F.
FREQUENCY-DEPENDENT CONDUCTIVITY IN BORON-DOPED AND PHOSPHORUS- DOPED AMORPHOUS-SILICON FILMS 1-gen-1992 Grasso, Vincenzo; Giorgianni, U; Neri, Fortunato; Trusso, S.
ENERGY-LOSS MEASUREMENTS AND ELECTRONIC-PROPERTIES OF THIANTHREN 1-gen-1992 Arena, Antonella; Girlanda, Raffaello; Martino, Giovanna; Neri, Fortunato; Saitta, Gaetano
THE DIELECTRIC-CONSTANT OF TCNQ SINGLE-CRYSTALS AS DEDUCED BY REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY 1-gen-1993 Mondio, Guglielmo; Neri, Fortunato; Curro, G; Patane', Salvatore; Compagnini, G.
TEMPERATURE-DEPENDENCE OF THE MNPS3 CRYSTAL FLUORESCENCE 1-gen-1993 Grasso, Vincenzo; Neri, Fortunato; Perillo, Paolo; Silipigni, Letteria
AMORPHOUS SILICON-CARBON FILMS PREPARED BY REACTIVE EVAPORATION 1-gen-1993 Giorgianni, U; Grasso, Vincenzo; Nardi, N; Neri, Fortunato; Trusso, S.
ELECTRICAL-CONDUCTIVITY OF LITHIUM-INTERCALATED THIOPHOSPHATE NIPS3 SINGLE-CRYSTALS 1-gen-1994 Giunta, G; Grasso, Vincenzo; Neri, Fortunato; Silipigni, Letteria
OPTICAL-CONSTANTS OF HYDROGENATED AMORPHOUS-CARBON IN THE RANGE 0-100 EV 1-gen-1994 Curro, G; Neri, Fortunato; Mondio, Guglielmo; Compagnini, G; Foti, G.
THE EFFECTS OF THE LITHIUM INTERCALATION ON THE X-RAY PHOTOELECTRON-SPECTRA OF NIPS3 1-gen-1995 Curro, Gm; Grasso, Vincenzo; Neri, Fortunato; Silipigni, Letteria
ELECTRONIC-PROPERTIES OF ION-IMPLANTED HYDROGENATED AMORPHOUS- CARBON 1-gen-1995 CURRO G; MONDIO G.; NERI F; FOTI G; COMPAGNINI G
Effects of lithium intercalation on the electronic properties of FePS3 single crystals 1-gen-1996 Silipigni, Letteria; Calareso, C; Curro, Gm; Neri, Fortunato; Grasso, Vincenzo; Berger, H; Margaritondo, G; Ponterio, R.
Pulsed laser ablation and deposition of PZT-based multilayer 1-gen-1997 Fuso, F; Ceresara, L; Iembo, A; Arimondo, E; Neri, Fortunato; Mondio, Guglielmo; Allegrini, M.
Energy loss spectroscopy of RuO2 thin films 1-gen-1997 Mondio, Guglielmo; Neri, Fortunato; Allegrini, M.
The low-energy absorption and reflectivity of Hg2P2S6 and Hg2P2Se6 1-gen-1997 CALARESO C; GRASSO V; NERI F.; SILIPIGNI L
Pulsed laser deposition and characterization of conductive RuO2 thin films 1-gen-1997 Iembo, A; Fuso, F; Arimondo, E; Ciofi, Carmine; Pennelli, G; Curro, Gm; Neri, Fortunato; Allegrini, M.
Particle sizing with a simple differential light-scattering photometer: Homogeneous spherical particles 1-gen-1997 Grasso, Vincenzo; Neri, Fortunato; Fucile, E.
Differential light-scattering photometer using a CCD camera 1-gen-1998 Neri, Fortunato; Pizzi, P; Romeo, G; Saija, Rosalba
Raman microscopy study of pulsed laser ablation deposited silicon carbide films 1-gen-1998 Neri, Fortunato; Trusso, S; Vasi, C; Barreca, Francesco; Valisa, P.
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