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Titolo Data di pubblicazione Autore(i) File
Micro-Raman study of reactive pulsed laser ablation deposited silicon carbon alloy films 1-gen-1998 Trusso, S; Vasi, C; Barreca, Francesco; Neri, Fortunato
Raman microscopy study of pulsed laser ablation deposited silicon carbide films 1-gen-1998 Neri, Fortunato; Trusso, S; Vasi, C; Barreca, Francesco; Valisa, P.
An X-ray photoemission spectroscopy study of the Sn2P2S6 monoclinic II phase 1-gen-1998 CURRO GM; GRASSO V; NERI F.; SILIPIGNI L
X-ray photoelectron spectroscopy of Au/Fe2O3 catalysts 1-gen-1999 Visco, Annamaria; Neri, Fortunato; Neri, Giovanni; Donato, A; Milone, Candida; Galvagno, Signorino
CNx thin films grown by pulsed laser deposition: Raman, infrared and X-ray photoelectron spectroscopy study 1-gen-1999 Trusso, S; Vasi, C; Neri, Fortunato
Growth and structural properties of hydrogenated silicon films deposited by pulsed laser ablation 1-gen-1999 TRUSSO S; VASI C; NERI F.
Correlation of structural and electrical transport properties in hydrogenated silicon films 1-gen-2000 Barreca, Francesco; Fazio, Enza; Neri, Fortunato; S., Trusso; C., Vasi
Measurement of the dielectric constant of amorphous CNx films in the 0-45 eV energy range 1-gen-2000 Barreca, Francesco; Mezzasalma, Angela Maria; Mondio, Guglielmo; Neri, Fortunato; Trusso, S; Vasi, C.
Optical constants of CNx thin films from reflection electron energy loss spectroscopy 1-gen-2000 Barreca, Francesco; Mezzasalma, Angela Maria; Mondio, Guglielmo; Neri, Fortunato; Trusso, S; Vasi, C.
Pulsed laser deposition of silicon and carbon based thin films 1-gen-2001 Barreca, Francesco; Fazio, Enza; Neri, Fortunato; Trusso, S.; Vasi, C.
Optical constants from reflection electro energy loss spectroscopy: theory and applications 1-gen-2001 Trusso, S.; Mondio, Guglielmo; Mezzasalma, Angela Maria; Neri, Fortunato; Barreca, Francesco
Quantitative estimation of the threefold and fourfold carbon coordination in amorphous CNx films 1-gen-2001 Mezzasalma, Angela Maria; Mondio, Guglielmo; Neri, Fortunato; Trusso, S.
Characterization of pulsed laser deposited a-C films by means of reflection electron energy loss spectroscopy 1-gen-2001 BARRECA F.; MEZZASALMA AM; MONDIO G; NERI F; TRUSSO S
An investigation of the electronic and structural properties of pulsed laser-deposited a-C films 1-gen-2001 Neri, Fortunato; Mondio, Guglielmo; Mezzasalma, Angela Maria; Fazio, Enza; Trusso, S; Fazio, B.
Influence of low level nitrogenation on the structural properties of pulsed laser ablation deposited a-CNx films 1-gen-2002 Fazio, Enza; Barreca, Francesco; Neri, Fortunato; Trusso, S.
Residual crystalline silicon phase in silicon-rich-oxide films subjected to high temperature annealing 1-gen-2002 FAZIO B; VULPIO M; GERARDI C; LIAO Y; CRUPI I; LOMBARDO S; TRUSSO S; NERI F.
Excimer laser ablation of silicon carbide ceramic targets 1-gen-2002 Neri, Fortunato; Barreca, Francesco; Trusso, S.
Bonding configurations and optical band gap for nitrogenated amorphous silicon carbide films prepared by pulsed laser ablation 1-gen-2002 TRUSSO S; BARRECA F.; NERI F
Thin Solid Films: Application, Preparation and Characterization 1-gen-2003 S., Trusso; Mondio, Guglielmo; Neri, Fortunato
Raman and infrared study of PLD deposited SiOx thin films 1-gen-2003 Fazio, Enza; Barreca, Francesco; E., Barletta; Neri, Fortunato; S., Trusso
Mostrati risultati da 41 a 60 di 278
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