CIOFI, Carmine

CIOFI, Carmine  

Dipartimento di Ingegneria  

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Risultati 1 - 20 di 153 (tempo di esecuzione: 0.055 secondi).
Titolo Data di pubblicazione Autore(i) File
A new correlation method for high sensitivity current noise measurements 1-gen-2007 Ciofi, Carmine; Scandurra, Graziella; R., Merlino; G., Cannat̀; Giusi, Gino
A new correlation method for high sensitivity current noise measurements. 1-gen-2007 Ciofi, Carmine; Scandurra, Graziella; Merlino, R; Cannata', Gianluca; Giusi, Gino
A New Method for High Sensitivity Noise Measurements 1-gen-2001 Ciofi, Carmine; Crupi, Felice; Pace, Calogero
A new technique for extracting the MOSFET threshold voltage using noise measurements 1-gen-2004 Giusi, Gino; Donato, Nicola; Ciofi, Carmine; Crupi, F.
A novel ultra sensitive method for voltage noise measurements 1-gen-2005 F., Crupi; Giusi, Gino; Ciofi, Carmine; C., Pace
A Power Line Communication Approach for Automotive Electromechanical Actuators 1-gen-2006 E., Arabia; A., Consoli; Ciofi, Carmine; R., Merlino; Testa, Antonio
A very low noise, high accuracy, programmable voltage source for low frequency noise measurements 1-gen-2014 G. Scandurra;G. Giusi;C. Ciofi
Accurate QTF sensing approach by means of narrow band spectral estimation 1-gen-2020 Scandurra, G.; Giusi, G.; Ciofi, C.
Adaptive Single Phase Decoding of LDPC Codes 1-gen-2006 M., Castano; M., Rovini; N. E., Linsalata; F., Rossi; R., Merlino; Ciofi, Carmine; L., Fanucci
Amperometric Biosensor and Front-End Electronics for Remote Glucose Monitoring by Crosslinked PEDOT-Glucose Oxidase 1-gen-2018 Aleeva, Yana; Maira, Giovanni; Scopelliti, Michelangelo; Vinciguerra, Vincenzo; Scandurra, Graziella; Cannata, Gianluca; Giusi, Gino; Ciofi, Carmine; Figa, Viviana; Occhipinti, Luigi G.; Pignataro, Bruno Giuseppe
Applications of integrated solar cells in low noise instrumentation 1-gen-2013 G. Scandurra;G. Cannata;G. Giusi;C. Ciofi
Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level 1-gen-2015 Giusi, G.; Giordano, O.; Scandurra, G.; Ciofi, C.; Rapisarda, M.; Calvi, S.
Automatic offset correction for measurements in the nV range 1-gen-2013 Scandurra, Graziella; Cannata', Gianluca; Ciofi, Carmine
Characterization of Al-Si-Cu Metal Lines by means of TEM Analysis and the SARF technique 1-gen-1997 Ciofi, Carmine; Franzese, M.; Neri, B.
CHARACTERIZATION OF YSZ FILMS BY MEANS OF C-V MEASUREMENTS AND TEM OBSERVATIONS 1-gen-1995 Bagnoli, Pe; Ciofi, Carmine; Diligenti, A; Innamorato, A; Nannini, A.
Comments on the Utilization of Noise Measurements for the Characterization of Electromigration in Metal Lines 1-gen-1997 Ciofi, Carmine; Dattilo, V.; Neri, B.
Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics 1-gen-2006 GIUSI G; CRUPI F; PACE C; CIOFI; GROESENEKEN G
Configurable low noise amplifier for voltage noise measurements 1-gen-2013 Scandurra, Graziella; G., Cannata; Giusi, Gino; Ciofi, Carmine
Copper Interconnection Lines: SARF characterization and Lifetime Test 1-gen-1996 Ciofi, Carmine; Dattilo, V.; Neri, B.
Copper metallizations for integrated circuits: TEM analysis and electrical characterization 1-gen-1997 Bruschi, P; Ciofi, Carmine; Dattilo, V; Diligenti, A; Nannini, A; Neri, B.