CALABRETTA, Michele
CALABRETTA, Michele
Dipartimento di Scienze chimiche, biologiche, farmaceutiche e ambientali
Assessing the Stress Induced by Novel Packaging in GaN HEMT Devices via Raman Spectroscopy
2024-01-01 Dahrouch, Z.; Malta, G.; D'Ambrosio, M.; Messina, A. A.; Musolino, M.; Sitta, A.; Calabretta, M.; Patane, S.
Deep Learning for Automatic Wafer Monitoring System
2023-01-01 Rundo, Francesco; Calabretta, Michele; Pino, Carmelo; Coffa, Salvatore; Messina, Angelo; Spampinato, Concetto; Battiato, Sebastiano
Dynamic Gate Stress: Advanced Characterization of an Automotive Grade Planar-Gate 1200 V SiC MOSFET
2025-01-01 Fiore, Michele; Sitta, Alessandro; Mauromicale, Giuseppe; Calabretta, Michele; Rundo, Francesco; Sequenzia, Gaetano; Iannuzzo, Francesco
Dynamic Reverse Bias: Lifetime Modeling for SiC MOSFET Automotive Application
2025-01-01 Sitta, Alessandro; Mauromicale, Giuseppe; Fiore, Michele; Salvo, Luciano; Nardo, Domenico; Amata, Benedetto; Nania, Massimo; Buonomo, Simone; Calabretta, Michele
Hyperbolic Deep Learning System for Intelligent Gate-Driving and Health Monitoring of Silicon-Carbide Power MOSFETs
2025-01-01 Rundo, F.; Messina, A. A.; Fiore, M.; Calabretta, M.; Coscia, P.; Battiato, S.
Investigation into the Aging Mechanisms of a SiC-Based Power MOSFET by Thermal and Thermomechanical Analysis
2025-01-01 D'Ambrosio, Moreno; Tripodi, Chiara; Garesci', Francesca; Cosio, Daniele; Bonanno, Domenico; Rundo, Francesco; Messina Angelo, Alberto; Imbruglia, Antonio; Calabretta, Michele; Patane', Salvatore
The reliability challenge of SiC Power Modules in Automotive Applications
2022-01-01 Calabretta, M.; Sitta, A.; Mauromicale, G.; Rundo, F.; Sequenzia, G.; Messina, A. A.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Assessing the Stress Induced by Novel Packaging in GaN HEMT Devices via Raman Spectroscopy | 1-gen-2024 | Dahrouch, Z.; Malta, G.; D'Ambrosio, M.; Messina, A. A.; Musolino, M.; Sitta, A.; Calabretta, M.; Patane, S. | |
| Deep Learning for Automatic Wafer Monitoring System | 1-gen-2023 | Rundo, Francesco; Calabretta, Michele; Pino, Carmelo; Coffa, Salvatore; Messina, Angelo; Spampinato, Concetto; Battiato, Sebastiano | |
| Dynamic Gate Stress: Advanced Characterization of an Automotive Grade Planar-Gate 1200 V SiC MOSFET | 1-gen-2025 | Fiore, Michele; Sitta, Alessandro; Mauromicale, Giuseppe; Calabretta, Michele; Rundo, Francesco; Sequenzia, Gaetano; Iannuzzo, Francesco | |
| Dynamic Reverse Bias: Lifetime Modeling for SiC MOSFET Automotive Application | 1-gen-2025 | Sitta, Alessandro; Mauromicale, Giuseppe; Fiore, Michele; Salvo, Luciano; Nardo, Domenico; Amata, Benedetto; Nania, Massimo; Buonomo, Simone; Calabretta, Michele | |
| Hyperbolic Deep Learning System for Intelligent Gate-Driving and Health Monitoring of Silicon-Carbide Power MOSFETs | 1-gen-2025 | Rundo, F.; Messina, A. A.; Fiore, M.; Calabretta, M.; Coscia, P.; Battiato, S. | |
| Investigation into the Aging Mechanisms of a SiC-Based Power MOSFET by Thermal and Thermomechanical Analysis | 1-gen-2025 | D'Ambrosio, Moreno; Tripodi, Chiara; Garesci', Francesca; Cosio, Daniele; Bonanno, Domenico; Rundo, Francesco; Messina Angelo, Alberto; Imbruglia, Antonio; Calabretta, Michele; Patane', Salvatore | |
| The reliability challenge of SiC Power Modules in Automotive Applications | 1-gen-2022 | Calabretta, M.; Sitta, A.; Mauromicale, G.; Rundo, F.; Sequenzia, G.; Messina, A. A. |