Salvo, Giuseppe
Salvo, Giuseppe
Universita' degli Studi di Messina
A complete microwave characterization of GaAs HEMTs under optical illumination
2013-01-01 Caddemi, A.; Crupi, G.; Fazio, E.; Patane, S.; Salvo, G.
A scalable HEMT noise model based on FW-EM analyses
2014-01-01 Nalli, Andrea; Raffo, Antonio; Vannini, Giorgio; D'Angelo, Sara; Resca, Davide; Scappaviva, Francesco; Crupi, Giovanni; Salvo, Giuseppe; Caddemi, Alina
Black-box noise modeling of GaAs HEMTs under illumination
2015-01-01 Colangeli, Sergio; Ciccognani, Walter; Limiti, Ernesto; Caddemi, Alina; Crupi, Giovanni; Salvo, Giuseppe
GaN HEMT modelling through 50-Ω NF measurements
2015-01-01 Nalli, Andrea; Raffo, Antonio; Crupi, Giovanni; D'Angelo, Sara; Resca, Davide; Scappaviva, Francesco; Salvo, Giuseppe; Caddemi, Alina; Vannini, Giorgio
GaN HEMT noise modeling based on 50-Ω noise factor
2015-01-01 Crupi, Giovanni; Caddemi, Alina; Raffo, Antonio; Salvo, Giuseppe; Nalli, Andrea; Vannini, Giorgio
Light sensitivity of GaAs pHEMT's: A close insight into the microwave noise behavior
2014-01-01 Caddemi, Alina; Crupi, Giovanni; Salvo, Giuseppe
Microwave effects of UV light exposure of a GaN HEMT: Measurements and model extraction
2016-01-01 Caddemi, Alina; Cardillo, Emanuele; Salvo, Giuseppe; Patane', Salvatore
Performance analysis of a microwave low-noise amplifier under laser illumination
2015-01-01 Caddemi, Alina; Cardillo, Emanuele; Crupi, Giovanni; Salvo, Giuseppe
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A complete microwave characterization of GaAs HEMTs under optical illumination | 1-gen-2013 | Caddemi, A.; Crupi, G.; Fazio, E.; Patane, S.; Salvo, G. | |
| A scalable HEMT noise model based on FW-EM analyses | 1-gen-2014 | Nalli, Andrea; Raffo, Antonio; Vannini, Giorgio; D'Angelo, Sara; Resca, Davide; Scappaviva, Francesco; Crupi, Giovanni; Salvo, Giuseppe; Caddemi, Alina | |
| Black-box noise modeling of GaAs HEMTs under illumination | 1-gen-2015 | Colangeli, Sergio; Ciccognani, Walter; Limiti, Ernesto; Caddemi, Alina; Crupi, Giovanni; Salvo, Giuseppe | |
| GaN HEMT modelling through 50-Ω NF measurements | 1-gen-2015 | Nalli, Andrea; Raffo, Antonio; Crupi, Giovanni; D'Angelo, Sara; Resca, Davide; Scappaviva, Francesco; Salvo, Giuseppe; Caddemi, Alina; Vannini, Giorgio | |
| GaN HEMT noise modeling based on 50-Ω noise factor | 1-gen-2015 | Crupi, Giovanni; Caddemi, Alina; Raffo, Antonio; Salvo, Giuseppe; Nalli, Andrea; Vannini, Giorgio | |
| Light sensitivity of GaAs pHEMT's: A close insight into the microwave noise behavior | 1-gen-2014 | Caddemi, Alina; Crupi, Giovanni; Salvo, Giuseppe | |
| Microwave effects of UV light exposure of a GaN HEMT: Measurements and model extraction | 1-gen-2016 | Caddemi, Alina; Cardillo, Emanuele; Salvo, Giuseppe; Patane', Salvatore | |
| Performance analysis of a microwave low-noise amplifier under laser illumination | 1-gen-2015 | Caddemi, Alina; Cardillo, Emanuele; Crupi, Giovanni; Salvo, Giuseppe |