CRUPI, Felice
CRUPI, Felice
Universita' degli Studi di Messina
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A Compact Model with Spin-Polarization Asymmetry for Nanoscaled Perpendicular MTJs
2017-01-01 De Rose, Raffaele; Lanuzza, Marco; D'Aquino, Massimiliano; Carangelo, Greta; Finocchio, Giovanni; Crupi, Felice; Carpentieri, Mario
A New Method for High Sensitivity Noise Measurements
2001-01-01 Ciofi, Carmine; Crupi, Felice; Pace, Calogero
Observation of hot-carrier-induced nFET gate-oxide breakdown in dynamically stressed CMOS circuits
2002-01-01 Kaczer, B.; Crupi, Felice; Degraeve, R.; Roussel, P.; Ciofi, Carmine; Groeseneken, G.
Very low noise, high accuracy, programmable voltage reference
2002-01-01 Pace, Calogero; Ciofi, Carmine; Crupi, Felice; Giacobbe, A.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A Compact Model with Spin-Polarization Asymmetry for Nanoscaled Perpendicular MTJs | 1-gen-2017 | De Rose, Raffaele; Lanuzza, Marco; D'Aquino, Massimiliano; Carangelo, Greta; Finocchio, Giovanni; Crupi, Felice; Carpentieri, Mario | |
| A New Method for High Sensitivity Noise Measurements | 1-gen-2001 | Ciofi, Carmine; Crupi, Felice; Pace, Calogero | |
| Observation of hot-carrier-induced nFET gate-oxide breakdown in dynamically stressed CMOS circuits | 1-gen-2002 | Kaczer, B.; Crupi, Felice; Degraeve, R.; Roussel, P.; Ciofi, Carmine; Groeseneken, G. | |
| Very low noise, high accuracy, programmable voltage reference | 1-gen-2002 | Pace, Calogero; Ciofi, Carmine; Crupi, Felice; Giacobbe, A. |