MALTA, GIULIANA
MALTA, GIULIANA
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Assessing the Stress Induced by Novel Packaging in GaN HEMT Devices via Raman Spectroscopy
2024-01-01 Dahrouch, Z.; Malta, G.; D'Ambrosio, M.; Messina, A. A.; Musolino, M.; Sitta, A.; Calabretta, M.; Patane, S.
High speed thermal mapping on six-pack SiC-based module for hybrid and electric vehicles
2022-01-01 Malta, G.; Anoldo, L.; Mazza, B.; Piccione, G. G.; Russo, A.; Calabretta, M.; Russo, S.; Sitta, A.; Messina, A.; Lionetto, A.; Patane, S.
Metal-Oxide-Metal (MOM) capacitors and GaN-based High Electron Mobility Transistors (HEMTs) devices for integrated circuits: a reliability study
2024-03-14 Malta, Giuliana
Multchip SiC-based compact module for automotive applications: A high speed thermal study
2022-01-01 Anoldo, L.; Malta, G.; Mazza, B.; Piccione, G. G.; Calabretta, M.; Russo, S.; Russo, A.; Sitta, A.; Messina, A.; Lionetto, A.; Patane, S.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Assessing the Stress Induced by Novel Packaging in GaN HEMT Devices via Raman Spectroscopy | 1-gen-2024 | Dahrouch, Z.; Malta, G.; D'Ambrosio, M.; Messina, A. A.; Musolino, M.; Sitta, A.; Calabretta, M.; Patane, S. | |
| High speed thermal mapping on six-pack SiC-based module for hybrid and electric vehicles | 1-gen-2022 | Malta, G.; Anoldo, L.; Mazza, B.; Piccione, G. G.; Russo, A.; Calabretta, M.; Russo, S.; Sitta, A.; Messina, A.; Lionetto, A.; Patane, S. | |
| Metal-Oxide-Metal (MOM) capacitors and GaN-based High Electron Mobility Transistors (HEMTs) devices for integrated circuits: a reliability study | 14-mar-2024 | Malta, Giuliana | |
| Multchip SiC-based compact module for automotive applications: A high speed thermal study | 1-gen-2022 | Anoldo, L.; Malta, G.; Mazza, B.; Piccione, G. G.; Calabretta, M.; Russo, S.; Russo, A.; Sitta, A.; Messina, A.; Lionetto, A.; Patane, S. |