Dielectric response of the manganese thiophosphate intercalatedwith potassium ions

The dielectric response of the layered MnPS 3 compound intercalated with potassium ions has been investigated as a function of frequency and temperature. The dielectric behavior, examined between 240 and 375 K and in the (20 Hz-1 MHz) frequency range, is characterized by a strong dispersion in the real and imaginary parts of the dielectric constant at the low frequencies and at the highest investigated temperatures. The obtained dielectric spectra, which have been interpreted on the basis of both the intercalation process by cationic substitution and the comparison with the observed dielectric response of the parent MnPS 3 and its intercalated compound with cesium ions Cs 0.46 Mn 0.77 PS 3 , have allowed us to define K 0.5 Mn 0.75 PS 3 as a hopping charge carrier system.