Among the frequency-dependent noise parameters Fo, Γo (magnitude and angle) and rn the value of Fo represents the minimum noise contribution of an active device in absence of any noise mismatch at the device input (which can be obtained at a single frequency) while rn is a measure of the noise figure degradation upon departure from the optimum value of the noise source reflection coefficient. As such, the performance of rn is of fundamental importance for the circuit designer when a broad-band low-noise amplifier has to be realized. In this paper, a comparative analysis and related comments are presented on the behavior of this noise parameter for different low-noise device types which have been characterized and modeled in our lab over the last ten years.

Comparative performance of the equivalent noise resistance of low-noise microwave FET's

CADDEMI, Alina;
1996-01-01

Abstract

Among the frequency-dependent noise parameters Fo, Γo (magnitude and angle) and rn the value of Fo represents the minimum noise contribution of an active device in absence of any noise mismatch at the device input (which can be obtained at a single frequency) while rn is a measure of the noise figure degradation upon departure from the optimum value of the noise source reflection coefficient. As such, the performance of rn is of fundamental importance for the circuit designer when a broad-band low-noise amplifier has to be realized. In this paper, a comparative analysis and related comments are presented on the behavior of this noise parameter for different low-noise device types which have been characterized and modeled in our lab over the last ten years.
1996
0780332237
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11570/2428823
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 2
  • ???jsp.display-item.citation.isi??? 0
social impact