This letter provides a clear understanding of the kink effect in S-22 for active solid-state electronic devices. The origin of the kink effect is ascribed to the intrinsic section of the transistor, whereas the extrinsic elements determine its shape at the extrinsic ports. Therefore, to fairly compare the kink effect for GaN and GaAs HEMTs, the present analysis is not only focused on the whole devices but also on their intrinsic sections. The experimental evidence shows that, independently of the specific semiconductor technology, the size and the frequency band of the kink effect are mainly due to the values of the intrinsic transconductance and capacitances, respectively.

Kink Effect in S22 for GaN and GaAs HEMTs

CRUPI, GIOVANNI
Primo
;
CADDEMI, Alina
Penultimo
;
2015-01-01

Abstract

This letter provides a clear understanding of the kink effect in S-22 for active solid-state electronic devices. The origin of the kink effect is ascribed to the intrinsic section of the transistor, whereas the extrinsic elements determine its shape at the extrinsic ports. Therefore, to fairly compare the kink effect for GaN and GaAs HEMTs, the present analysis is not only focused on the whole devices but also on their intrinsic sections. The experimental evidence shows that, independently of the specific semiconductor technology, the size and the frequency band of the kink effect are mainly due to the values of the intrinsic transconductance and capacitances, respectively.
2015
Inglese
STAMPA
IEEE
25
5
301
303
3
https://ieeexplore.ieee.org/document/7072575
Internazionale
Esperti anonimi
Equivalent circuit, GaAs, GaN, HEMT, Kink effect, Scattering parameter measurements
no
info:eu-repo/semantics/article
Crupi, Giovanni; Raffo, Antonio; Caddemi, Alina; Vannini, Giorgio
14.a Contributo in Rivista::14.a.1 Articolo su rivista
4
262
restricted
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11570/3068217
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