Noise parameters of high electron mobility transistors (HEMT) at microwave frequencies are a subject of active research since the knowledge of their performance is of key importance for the use of these devices for designing low-noise amplifiers. Employs a simple noise model to derive the analytical expressions for the device noise parameters F0, G0 and N in terms of the electrical elements associated with the basic equivalent circuit of an HEMT. Analyses such expressions to establish some fundamental relationships, as well as the expected noise performance of the device when the parasitic elements representing package effects are included.

Noise parameters of HEMTs: Analysis of their properties from a circuit model approach

CADDEMI, Alina;
1996

Abstract

Noise parameters of high electron mobility transistors (HEMT) at microwave frequencies are a subject of active research since the knowledge of their performance is of key importance for the use of these devices for designing low-noise amplifiers. Employs a simple noise model to derive the analytical expressions for the device noise parameters F0, G0 and N in terms of the electrical elements associated with the basic equivalent circuit of an HEMT. Analyses such expressions to establish some fundamental relationships, as well as the expected noise performance of the device when the parasitic elements representing package effects are included.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11570/800
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