IRIS
PANARELLO, Saverio
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 579
EU - Europa 484
AS - Asia 98
SA - Sud America 12
Totale 1.173
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 579
IE - Irlanda 143
SE - Svezia 139
IT - Italia 93
CN - Cina 90
UA - Ucraina 24
DE - Germania 23
FI - Finlandia 20
BE - Belgio 18
GB - Regno Unito 17
BR - Brasile 12
IN - India 4
PL - Polonia 4
JP - Giappone 2
NL - Olanda 2
VN - Vietnam 2
FR - Francia 1
Totale 1.173
Salva come PNG Salva come JPEG
Città #
Dublin 143
Chandler 132
Nyköping 89
Jacksonville 59
Ashburn 53
Messina 51
Ann Arbor 50
Beijing 37
Princeton 23
Medford 21
Cambridge 20
Catania 20
Brussels 18
Dearborn 16
Des Moines 14
Wilmington 10
Boardman 9
Woodbridge 9
Jinan 7
Duncan 6
Hebei 6
Ningbo 5
Seattle 5
Fuzhou 4
Pune 4
San Mateo 4
Shenyang 4
Warsaw 4
Changsha 3
Helsinki 3
Nanchang 3
Nanjing 3
Norwalk 3
São Paulo 3
Taiyuan 3
Washington 3
Bologna 2
Dong Ket 2
Haikou 2
Houston 2
Jiaxing 2
Lancaster 2
Pozzo Di Gotto 2
Siracusa 2
Torino 2
Borghetto Santo Spirito 1
Catanzaro 1
Chengdu 1
Eindhoven 1
Hangzhou 1
Hanover 1
Hefei 1
Lanzhou 1
Los Angeles 1
Meppel 1
Milan 1
Newark 1
Nuremberg 1
Quincy 1
Redmond 1
San Fior 1
Sortino 1
Tianjin 1
Tokyo 1
Toulon 1
Umeda 1
Zhengzhou 1
Totale 887
Salva come PNG Salva come JPEG
Nome #
Reliability of planar, Super-Junction and trench low voltage power MOSFETs 80
A New Approach for Impedance Tracking of Piezoelectric Vibration Energy Harvesters Based on a Zeta Converter 73
Stress analysis and lifetime estimation on Power MOSFETs for automotive ABS systems 69
Improving ICs reliability with high speed thermal mapping 68
Reliability Assessment of Power MOSFETs Working in Avalanche Mode Based on a Thermal Strain Direct Measurement Approach 65
Reliability assessment of Low-Voltage MOSFETs driving inductive loads 60
Stress Analysis and Lifetime Estimation on Power MOSFETs for Automotive ABS Systems 59
Reliability Assessment on Power MOSFETs Working in Energy Absorption Mode 58
An Infrared Thermal Measuring System for Automotive Applications and Reliability Improvement 56
Lifetime estimation of Super-junction Power MOSFETs under short circuit and repeated avalanche operations 54
Reliability model application for power devices using mechanical strain real time mapping 53
A PZT-based Energy Harvester with Working Point Optimization 52
Improving ICs reliability with high speed thermal mapping 52
Reliability Assessment of Power MOSFETs Working in Avalanche Mode Based on a Thermal Strain Direct Measurement Approach 50
Thermal stress and mechanical strain real time mapping in Intelligent Power Switches device2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) 45
Une interface multilingue pour l'édition électronique des dossiers de "Bouvard et Pécuchet" 44
A Buck-Boost based DC/AC Converter for Residential PV Applications 43
Comparative reliability assessment of Planar and Trench Gate Power MOSFETs for Automotive Applications 42
null 36
APPARATO E METODO PER LA GENERAZIONE DI CAMPI ELETTRICI PULSATI AD ALTA INTENSITÀ 36
Study of the thermomechanical strain induced by current pulses in SiC-based Power MOSFET 34
Reliability Assessment of Avalanche Mode Operating Power MOSFETs through Coffin Manson Law based Mathematical Models 34
FMEA and lifetime estimation of power MOSFETs for ABS systems 27
null 20
An infrared thermal measuring system for automotive 9
Totale 1.219
Salva come PNG Salva come JPEG
Categoria #
all - tutte 4.328
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.328
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/20195 0 0 0 0 0 0 0 0 0 0 1 4
2019/2020139 11 6 4 3 1 18 22 12 3 32 22 5
2020/2021159 12 2 24 27 20 13 5 18 7 16 5 10
2021/2022175 16 23 1 8 2 1 16 10 4 16 26 52
2022/2023489 35 64 27 32 32 44 7 34 165 4 36 9
2023/2024121 7 18 11 25 16 26 6 5 0 6 1 0
Totale 1.219