On the microwave noise figure measurement: A virtual approach for mismatched devices

In this paper, the challenging task of the 50 Ω noise figure measurement of mismatched devices has been addressed by tailoring a microwave virtual test-bench in a computer-aided design environment. The effects of the real measurement chain on the device noise figure as well as that of the noise figure meter and noise source have been taken into account by characterizing and modeling every component. The effectiveness of the simulation has been proven by comparing the virtual test-bench noise figure with that calculated from the measured scattering and noise parameters of a 0.15 µm pHEMT in the 2–26 GHz frequency range. Hereby, all the processes involved in the 50 Ω noise figure measurements of mismatched devices have been presented by a visual and user-friendly interface. By this original approach, a fast evaluation of each component role in the measurement chain can be accomplished. A performance estimation of the system can be performed and updated in a simple way whenever a component is replaced. Finally, since every step of the procedure has been disclosed and extensively clarified, it might be used as a training tool for microwave engineers.