IRIS
GIUSI, Gino
 Distribuzione geografica
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Continente #
NA - Nord America 2.354
AS - Asia 1.522
EU - Europa 1.443
SA - Sud America 709
AF - Africa 55
Continente sconosciuto - Info sul continente non disponibili 2
OC - Oceania 1
Totale 6.086
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Nazione #
US - Stati Uniti d'America 2.313
SG - Singapore 672
BR - Brasile 619
IE - Irlanda 519
SE - Svezia 365
CN - Cina 361
HK - Hong Kong 223
VN - Vietnam 131
IT - Italia 127
FI - Finlandia 82
RU - Federazione Russa 80
PL - Polonia 60
DE - Germania 55
UA - Ucraina 43
IN - India 38
AR - Argentina 35
FR - Francia 28
GB - Regno Unito 28
CI - Costa d'Avorio 21
BE - Belgio 19
MX - Messico 17
EC - Ecuador 16
IQ - Iraq 14
TR - Turchia 13
CO - Colombia 12
BD - Bangladesh 11
CA - Canada 11
CZ - Repubblica Ceca 11
ZA - Sudafrica 10
PY - Paraguay 8
VE - Venezuela 8
AT - Austria 7
PK - Pakistan 7
AZ - Azerbaigian 6
ID - Indonesia 6
UZ - Uzbekistan 6
MA - Marocco 5
CL - Cile 4
DO - Repubblica Dominicana 4
DZ - Algeria 4
LK - Sri Lanka 4
PE - Perù 4
EG - Egitto 3
KE - Kenya 3
KZ - Kazakistan 3
LT - Lituania 3
NI - Nicaragua 3
NP - Nepal 3
SN - Senegal 3
BH - Bahrain 2
CG - Congo 2
ES - Italia 2
EU - Europa 2
GR - Grecia 2
IL - Israele 2
JM - Giamaica 2
JO - Giordania 2
JP - Giappone 2
LB - Libano 2
NL - Olanda 2
PS - Palestinian Territory 2
SA - Arabia Saudita 2
TM - Turkmenistan 2
TN - Tunisia 2
TW - Taiwan 2
UY - Uruguay 2
AE - Emirati Arabi Uniti 1
AU - Australia 1
BA - Bosnia-Erzegovina 1
BB - Barbados 1
BG - Bulgaria 1
BJ - Benin 1
BO - Bolivia 1
BY - Bielorussia 1
HN - Honduras 1
HR - Croazia 1
HU - Ungheria 1
IR - Iran 1
KG - Kirghizistan 1
LA - Repubblica Popolare Democratica del Laos 1
MD - Moldavia 1
MK - Macedonia 1
ML - Mali 1
OM - Oman 1
PA - Panama 1
PT - Portogallo 1
RO - Romania 1
RS - Serbia 1
TH - Thailandia 1
TT - Trinidad e Tobago 1
Totale 6.086
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Città #
Dublin 519
Chandler 334
Ashburn 306
Dallas 294
Nyköping 283
Singapore 261
Hong Kong 222
Beijing 180
Jacksonville 128
Princeton 91
Cambridge 79
Dearborn 75
Ann Arbor 69
Des Moines 67
Medford 66
The Dalles 62
Warsaw 54
Los Angeles 52
Messina 43
Redondo Beach 39
Ho Chi Minh City 38
Buffalo 37
São Paulo 37
Dong Ket 36
Pune 31
San Mateo 31
Boardman 27
Wilmington 25
Moscow 24
Catania 23
Abidjan 21
Hanoi 20
Munich 20
Shenyang 19
Jinan 18
Brussels 17
Tianjin 15
Rio de Janeiro 13
Houston 12
Nanjing 11
New York 11
Casamassima 10
Haikou 10
Turku 10
Belo Horizonte 9
Brasília 9
Hebei 9
Ningbo 8
Baghdad 7
Brno 7
Brooklyn 7
Goiânia 7
Santo André 7
Baku 6
Betim 6
Haiphong 6
Johannesburg 6
London 6
Nanchang 6
Porto Alegre 6
Salvador 6
Santa Clara 6
Woodbridge 6
Zhengzhou 6
Campinas 5
Chicago 5
Curitiba 5
Dhaka 5
Guangzhou 5
Jiaxing 5
Quito 5
Recife 5
Swindon 5
Treviglio 5
Alvorada 4
Ankara 4
Bauru 4
Cabo Frio 4
Carapicuíba 4
Changsha 4
Charlotte 4
Conselheiro Lafaiete 4
Contagem 4
Falls Church 4
Fortaleza 4
Jequié 4
Juiz de Fora 4
Lappeenranta 4
Lima 4
Marília 4
Milan 4
Nuremberg 4
Rio Grande 4
Santa Maria 4
Suzano 4
Taizhou 4
Tashkent 4
Apucarana 3
Araçatuba 3
Atlanta 3
Totale 4.027
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Nome #
Amperometric Biosensor and Front-End Electronics for Remote Glucose Monitoring by Crosslinked PEDOT-Glucose Oxidase 137
A new technique for extracting the MOSFET threshold voltage using noise measurements 125
A new approach to DC removal in high gain, low noise voltage amplifiers 121
A simple and effective testbench for quartz tuning fork characterization and sensing applications 120
A differential-input, differential-output preamplifier topology for the design of ultra-low noise voltage amplifiers 112
1/f Noise in drain and gate current of MOSFETs with high-k gate stacks 106
Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level 106
Accurate QTF sensing approach by means of narrow band spectral estimation 106
A new correlation method for high sensitivity current noise measurements. 106
A novel ultra sensitive method for voltage noise measurements 99
Low-frequency spectral estimation (f<1 Hz) employing PC soundcards 99
Investigation of Gate Direct-Current and Fluctuations in Organic p-Type Thin-Film Transistors 99
A model for MOS gate stack quality evaluation based on the gate current 1/f noise 96
A Backscattering Model Incorporating the Effective Carrier Temperature in Nano‑MOSFET 95
QLSA: A Software Library for Spectral Estimation in Low-Frequency Noise Measurement Applications 94
Design and Realization of High-Accuracy Static Analog Memories (SAMs) Using Low-Cost DA Converters 93
A programmable bias current compensation approach in current noise measurement applications 93
An algorithm for separating multilevel random telegraph signal from 1f noise 92
Ultraflexible Tactile Piezoelectric Sensor Based on Low-Temperature Polycrystalline Silicon Thin-Film Transistor Technology 92
High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors 91
A procedure for extracting 1/f noise from random telegraph signals 89
Evidence of Correlated Mobility Fluctuations in p-Type Organic Thin-Film Transistors 89
A very low noise, high accuracy, programmable voltage source for low frequency noise measurements 88
A PC based platform for accurate quartz tuning fork characterization and sensing applications 82
Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics 80
Low frequency noise measurements as an early indicator of degradation for devices on plastic substrates subjected to mechanical stress 80
Design and realization of high accuracy SAM (static analog memories) using low cost DA converters 79
Low frequency noise measurements in p-type Metal-Base Vertical Organic Transistors 79
A microscopically accurate model of partially ballistic nanoMOSFETs in saturation based on channel backscattering 78
Dedicated instrumentation for single-electron effects detection in Si nanocrystal memories 78
Experimental extraction of barrier lowering and backscattering in saturated short-channel MOSFETs 76
Long term stability estimation of DC electrical source from low frequency noise measurements 75
Correlated Mobility Fluctuations and Contact Effects in p-Type Organic Thin-Film Transistors 75
Programmable, very low noise current source 75
Configurable low noise amplifier for voltage noise measurements 72
Quasi-logarithmic frequency resolution approach in DFT based spectral estimation 72
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures 70
Integrated method for impedance and low frequency noise measurements 70
Low-frequency (1/f) noise behavior of locally stressed HfO2/TiN gate-stack pMOSFETs 66
Dedicated instrumentation for high sensitivity, low frequency noise measurement systems 65
Barrier lowering and backscattering extraction in short-channel MOSFETs 64
Ultra-low-noise large-bandwidth transimpedance amplifier 63
Noise analysis in advanced memory devices 63
Investigation on the Conduction Mechanisms in Metal-Base Vertical Organic Transistors by DC and LF-Noise Measurements 63
Two-channel amplifier for high-sensitivity voltage noise measurements 62
Gate bias system for OTFT electrical characterisation and low-frequency noise measurements 62
A Two-Channel DFT Spectrum Analyzer for Fluctuation Enhanced Sensing Based on a PC Audio Board 62
Applications of integrated solar cells in low noise instrumentation 61
Single JFET front-end amplifier for low frequency noise measurements with cross correlation-based gain calibration 61
Variability of the drain current in junctionless nanotransistors induced by random dopant fluctuation 59
Three-channel amplifier for high-sensitivity voltage noise measurements 59
Investigation on junctionless floating body DRAMs including Trap Assisted Tunneling 59
Junction engineering of 1T-DRAMs 58
A Simple, Portable, Two Channels Correlation Spectrum Analyzer for Low Frequency Noise Measurements 57
Estimation Errors in 1/fγ noise spectra when employing DFT spectrum analyzers 57
Bipolar mode Operation and scalability of double-gate capacitorless 1T-DRAM cells 54
Full model and characterization of noise in operational amplifier 54
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks 54
Electrical instability in short channel organic thin-film transistors induced by lucky-polaron mechanism 54
Floating body dram with body raised and source/drain separation 52
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique 51
Ultrasensitive method for current noise measurements 50
Four channels cross correlation method for high sensitivity current noise measurements 50
Portable Knee Health Monitoring System by Impedance Spectroscopy Based on Audio-Board 48
Multi Channel Amplifier Topologies for High-Sensitivity and Reduced Measurement Time in Voltage Noise Measurements 48
Detection and classification of single-electron jumps in Si nanocrystal memories 48
Understanding and optimization of hot-carrier reliability in Germanium-on-Silicon pMOSFETs 47
Low Frequency Noise in DNTT/Cytop™ Based Organic Thin Film Transistors 45
Low-frequency (1/f) noise behavior of locally stressed HfO2/ TiN gate-stack pMOSFETs 45
Modeling of nanoscale devices with carriers obeying a three-dimensional density of states 44
Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies 43
Modeling the gate current 1/f noise and its application to advanced CMOS devices 43
Performance and reliability of strained-silicon nMOSFETs with SiN cap layer 42
Impact of Interface Traps in Floating-Gate Memory Based on Monolayer MoS2 40
Time-dependent analysis of low VDD program operation in double-gate SONOS memories by full-band Monte Carlo simulation 40
Impact of electrode composition and processing on the low-frequency noise in SrTiO3 MIM capacitors 40
Cross-correlation-based trans-impedance amplifier for current noise measurements 40
On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low-frequency noise measurements 40
Large bandwidth op-amp based white noise current source 39
Preamplifier topology for fluctuation enhanced sensing 39
Enhanced sensitivity cross-correlation method for voltage noise measurements 38
Study of warm-electron injection in double-gate SONOS by full-band Monte Carlo simulation 38
Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs 37
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics 37
Instrumentation design for gate and drain low frequency noise measurements 35
On the impact of defects close to the gate electrode on the low-frequency 1/f noise 35
Criticisms on and comparison of experimental channel backscattering extraction methods 33
Low-Power Artificial Neural Network Perceptron Based on Monolayer MoS2 32
Ultrasensitive low noise voltage amplifier for spectral analysis 32
Physical insights of body effect and charge degradation in floating-body DRAMs 31
Does strain engineering impact the gate stack quality and reliability? 31
On the dc and noise properties of the gate current in epitaxial Ge p -channel metal oxide semiconductor field effect transistors with TiNTaNHf O2 Si O2 gate stack 31
Impact strain engineering on gate stack quality and reliability 26
Instrumentation design for cross-correlation measurements between gate and drain low frequency noise in MOSFETs 26
Portable and highly versatile impedance meter for very low frequency measurements 21
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Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors 10
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Modeling the diffusion and depletion capacitances of a silicon pn diode in forward bias with impedance spectroscopy 8
Totale 6.217
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Categoria #
all - tutte 27.592
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 27.592
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021187 0 0 0 0 0 10 12 12 61 35 10 47
2021/2022462 3 25 12 39 19 3 16 25 11 10 117 182
2022/20231.351 123 101 81 108 69 127 11 77 620 4 26 4
2023/2024324 31 37 27 92 20 57 1 16 6 2 6 29
2024/20251.510 24 11 14 57 111 6 40 305 453 99 107 283
2025/20261.493 171 303 334 360 304 21 0 0 0 0 0 0
Totale 6.227