GIUSI, Gino
 Distribuzione geografica
Continente #
NA - Nord America 3.856
EU - Europa 3.272
AS - Asia 1.977
SA - Sud America 759
Continente sconosciuto - Info sul continente non disponibili 145
AF - Africa 69
OC - Oceania 1
Totale 10.079
Nazione #
US - Stati Uniti d'America 3.759
RU - Federazione Russa 1.727
SG - Singapore 834
BR - Brasile 642
IE - Irlanda 519
CN - Cina 512
SE - Svezia 365
HK - Hong Kong 244
IT - Italia 181
VN - Vietnam 160
FR - Francia 118
FI - Finlandia 82
PL - Polonia 62
DE - Germania 60
IN - India 56
UA - Ucraina 47
GB - Regno Unito 40
AR - Argentina 39
CA - Canada 30
BD - Bangladesh 28
CI - Costa d'Avorio 21
CO - Colombia 21
BE - Belgio 20
EC - Ecuador 20
IQ - Iraq 19
MX - Messico 19
TR - Turchia 19
VE - Venezuela 13
ZA - Sudafrica 12
CZ - Repubblica Ceca 11
ID - Indonesia 11
PK - Pakistan 11
CR - Costa Rica 8
PY - Paraguay 8
UZ - Uzbekistan 8
AT - Austria 7
AZ - Azerbaigian 7
JM - Giamaica 7
MA - Marocco 7
NP - Nepal 7
PH - Filippine 7
CL - Cile 6
TN - Tunisia 6
DO - Repubblica Dominicana 5
DZ - Algeria 5
ES - Italia 5
HN - Honduras 5
IL - Israele 5
JP - Giappone 5
KE - Kenya 5
NI - Nicaragua 5
LK - Sri Lanka 4
LT - Lituania 4
MY - Malesia 4
PE - Perù 4
AE - Emirati Arabi Uniti 3
BB - Barbados 3
EG - Egitto 3
GT - Guatemala 3
JO - Giordania 3
KZ - Kazakistan 3
NL - Olanda 3
OM - Oman 3
PS - Palestinian Territory 3
PT - Portogallo 3
RO - Romania 3
SA - Arabia Saudita 3
SN - Senegal 3
TH - Thailandia 3
TT - Trinidad e Tobago 3
UY - Uruguay 3
BG - Bulgaria 2
BH - Bahrain 2
BO - Bolivia 2
CG - Congo 2
EU - Europa 2
GR - Grecia 2
HU - Ungheria 2
LA - Repubblica Popolare Democratica del Laos 2
LB - Libano 2
PR - Porto Rico 2
RS - Serbia 2
SV - El Salvador 2
TM - Turkmenistan 2
TW - Taiwan 2
AU - Australia 1
BA - Bosnia-Erzegovina 1
BJ - Benin 1
BY - Bielorussia 1
CU - Cuba 1
EE - Estonia 1
GD - Grenada 1
GY - Guiana 1
HR - Croazia 1
IR - Iran 1
KG - Kirghizistan 1
KH - Cambogia 1
KN - Saint Kitts e Nevis 1
KR - Corea 1
KY - Cayman, isole 1
Totale 9.927
Città #
Ashburn 613
Moscow 530
Dublin 519
Singapore 367
Chandler 334
Dallas 300
Nyköping 283
San Jose 250
Hong Kong 242
Beijing 190
Jacksonville 130
Council Bluffs 128
Princeton 92
The Dalles 90
Lauterbourg 81
Cambridge 79
Dearborn 75
Des Moines 70
Ann Arbor 69
Medford 66
Los Angeles 65
Warsaw 54
Ho Chi Minh City 48
Messina 43
Redondo Beach 40
São Paulo 39
Buffalo 38
Dong Ket 36
Santa Clara 36
Pune 32
San Mateo 31
Boardman 30
Hanoi 26
Catania 25
Wilmington 25
Guangzhou 22
Tianjin 22
Abidjan 21
Atlanta 21
Munich 20
Shenyang 19
Brussels 18
Jinan 18
New York 18
Houston 17
Rio de Janeiro 14
Chicago 13
Phoenix 13
Brooklyn 12
Belo Horizonte 11
Nanjing 11
Brasília 10
Casamassima 10
Haikou 10
Milan 10
Shanghai 10
Turku 10
Baghdad 9
Hebei 9
North Bergen 9
Orem 9
Rome 9
Denver 8
Ningbo 8
Shenzhen 8
Baku 7
Brno 7
Goiânia 7
Montreal 7
Nanchang 7
Porto Alegre 7
Santo André 7
Woodbridge 7
Ankara 6
Betim 6
Chennai 6
Columbus 6
Dhaka 6
Haiphong 6
Hillsboro 6
Istanbul 6
Johannesburg 6
London 6
Quito 6
Salvador 6
San José 6
Tashkent 6
Zhengzhou 6
Bogotá 5
Campinas 5
Charlotte 5
Curitiba 5
Fortaleza 5
Frankfurt am Main 5
Jiaxing 5
Kingston 5
Managua 5
Medellín 5
Mumbai 5
Nairobi 5
Totale 5.681
Nome #
A new approach to DC removal in high gain, low noise voltage amplifiers 282
Amperometric Biosensor and Front-End Electronics for Remote Glucose Monitoring by Crosslinked PEDOT-Glucose Oxidase 216
Low frequency noise measurements as an early indicator of degradation for devices on plastic substrates subjected to mechanical stress 207
Gate bias system for OTFT electrical characterisation and low-frequency noise measurements 198
A new technique for extracting the MOSFET threshold voltage using noise measurements 181
A differential-input, differential-output preamplifier topology for the design of ultra-low noise voltage amplifiers 176
A simple and effective testbench for quartz tuning fork characterization and sensing applications 175
Accurate QTF sensing approach by means of narrow band spectral estimation 174
1/f Noise in drain and gate current of MOSFETs with high-k gate stacks 165
A new correlation method for high sensitivity current noise measurements. 164
A model for MOS gate stack quality evaluation based on the gate current 1/f noise 160
Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level 155
A programmable bias current compensation approach in current noise measurement applications 155
A novel ultra sensitive method for voltage noise measurements 150
A procedure for extracting 1/f noise from random telegraph signals 149
A very low noise, high accuracy, programmable voltage source for low frequency noise measurements 147
QLSA: A Software Library for Spectral Estimation in Low-Frequency Noise Measurement Applications 147
Ultraflexible Tactile Piezoelectric Sensor Based on Low-Temperature Polycrystalline Silicon Thin-Film Transistor Technology 147
A Backscattering Model Incorporating the Effective Carrier Temperature in Nano‑MOSFET 145
Design and Realization of High-Accuracy Static Analog Memories (SAMs) Using Low-Cost DA Converters 144
An algorithm for separating multilevel random telegraph signal from 1f noise 142
Evidence of Correlated Mobility Fluctuations in p-Type Organic Thin-Film Transistors 142
Low-frequency spectral estimation (f<1 Hz) employing PC soundcards 135
A PC based platform for accurate quartz tuning fork characterization and sensing applications 135
Investigation of Gate Direct-Current and Fluctuations in Organic p-Type Thin-Film Transistors 135
A microscopically accurate model of partially ballistic nanoMOSFETs in saturation based on channel backscattering 130
Low frequency noise measurements in p-type Metal-Base Vertical Organic Transistors 130
A Two-Channel DFT Spectrum Analyzer for Fluctuation Enhanced Sensing Based on a PC Audio Board 130
A Simple, Portable, Two Channels Correlation Spectrum Analyzer for Low Frequency Noise Measurements 122
High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors 118
Dedicated instrumentation for single-electron effects detection in Si nanocrystal memories 116
Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics 115
Ultra-low-noise large-bandwidth transimpedance amplifier 111
Long term stability estimation of DC electrical source from low frequency noise measurements 110
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures 109
Correlated Mobility Fluctuations and Contact Effects in p-Type Organic Thin-Film Transistors 108
Design and realization of high accuracy SAM (static analog memories) using low cost DA converters 106
Quasi-logarithmic frequency resolution approach in DFT based spectral estimation 105
Configurable low noise amplifier for voltage noise measurements 104
Integrated method for impedance and low frequency noise measurements 101
Experimental extraction of barrier lowering and backscattering in saturated short-channel MOSFETs 100
Programmable, very low noise current source 98
Low Frequency Noise in DNTT/Cytop™ Based Organic Thin Film Transistors 96
Variability of the drain current in junctionless nanotransistors induced by random dopant fluctuation 94
Low-frequency (1/f) noise behavior of locally stressed HfO2/TiN gate-stack pMOSFETs 91
Dedicated instrumentation for high sensitivity, low frequency noise measurement systems 91
Applications of integrated solar cells in low noise instrumentation 91
Noise analysis in advanced memory devices 90
Junction engineering of 1T-DRAMs 90
Bipolar mode Operation and scalability of double-gate capacitorless 1T-DRAM cells 88
Investigation on the Conduction Mechanisms in Metal-Base Vertical Organic Transistors by DC and LF-Noise Measurements 88
Estimation Errors in 1/fγ noise spectra when employing DFT spectrum analyzers 87
Two-channel amplifier for high-sensitivity voltage noise measurements 87
Single JFET front-end amplifier for low frequency noise measurements with cross correlation-based gain calibration 86
Investigation on junctionless floating body DRAMs including Trap Assisted Tunneling 86
Impact of Interface Traps in Floating-Gate Memory Based on Monolayer MoS2 84
Full model and characterization of noise in operational amplifier 83
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks 83
Barrier lowering and backscattering extraction in short-channel MOSFETs 83
Low-Power Artificial Neural Network Perceptron Based on Monolayer MoS2 82
Modeling the gate current 1/f noise and its application to advanced CMOS devices 81
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique 81
Understanding and optimization of hot-carrier reliability in Germanium-on-Silicon pMOSFETs 81
Detection and classification of single-electron jumps in Si nanocrystal memories 81
Ultrasensitive method for current noise measurements 80
Three-channel amplifier for high-sensitivity voltage noise measurements 79
Four channels cross correlation method for high sensitivity current noise measurements 78
Portable Knee Health Monitoring System by Impedance Spectroscopy Based on Audio-Board 77
Electrical instability in short channel organic thin-film transistors induced by lucky-polaron mechanism 76
Modeling of nanoscale devices with carriers obeying a three-dimensional density of states 75
Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies 74
Preamplifier topology for fluctuation enhanced sensing 74
Low-frequency (1/f) noise behavior of locally stressed HfO2/ TiN gate-stack pMOSFETs 72
Physical insights of body effect and charge degradation in floating-body DRAMs 71
Floating body dram with body raised and source/drain separation 71
Multi Channel Amplifier Topologies for High-Sensitivity and Reduced Measurement Time in Voltage Noise Measurements 68
Performance and reliability of strained-silicon nMOSFETs with SiN cap layer 67
Cross-correlation-based trans-impedance amplifier for current noise measurements 64
On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low-frequency noise measurements 64
Impact of electrode composition and processing on the low-frequency noise in SrTiO3 MIM capacitors 63
Instrumentation design for gate and drain low frequency noise measurements 61
Enhanced sensitivity cross-correlation method for voltage noise measurements 59
On the impact of defects close to the gate electrode on the low-frequency 1/f noise 59
Study of warm-electron injection in double-gate SONOS by full-band Monte Carlo simulation 59
Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors 58
Time-dependent analysis of low VDD program operation in double-gate SONOS memories by full-band Monte Carlo simulation 58
Large bandwidth op-amp based white noise current source 58
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics 56
Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs 55
Does strain engineering impact the gate stack quality and reliability? 53
Criticisms on and comparison of experimental channel backscattering extraction methods 52
Ultrasensitive low noise voltage amplifier for spectral analysis 52
On the dc and noise properties of the gate current in epitaxial Ge p -channel metal oxide semiconductor field effect transistors with TiNTaNHf O2 Si O2 gate stack 50
Instrumentation design for cross-correlation measurements between gate and drain low frequency noise in MOSFETs 49
Impact strain engineering on gate stack quality and reliability 46
Portable and highly versatile impedance meter for very low frequency measurements 45
Modeling the diffusion and depletion capacitances of a silicon pn diode in forward bias with impedance spectroscopy 27
From Structure to Performance: The Critical Role of DNTT Morphology in Organic TFTs 19
null 15
DEDICATED INSTRUMENTATION FOR HIGH SENSITIVITY, LOW FREQUENCY NOISE MEASUREMENT SYSTEMS 14
Totale 10.041
Categoria #
all - tutte 38.412
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 38.412


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022422 0 0 0 39 19 3 16 25 11 10 117 182
2022/20231.351 123 101 81 108 69 127 11 77 620 4 26 4
2023/2024324 31 37 27 92 20 57 1 16 6 2 6 29
2024/20251.510 24 11 14 57 111 6 40 305 453 99 107 283
2025/20264.244 171 303 334 360 304 924 469 509 479 169 128 94
2026/20271.101 108 480 190 323 0 0 0 0 0 0 0 0
Totale 10.079