IRIS
GIUSI, Gino
 Distribuzione geografica
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Continente #
EU - Europa 3.217
NA - Nord America 2.838
AS - Asia 1.933
SA - Sud America 748
AF - Africa 68
Continente sconosciuto - Info sul continente non disponibili 2
OC - Oceania 1
Totale 8.807
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Nazione #
US - Stati Uniti d'America 2.786
RU - Federazione Russa 1.724
SG - Singapore 831
BR - Brasile 637
IE - Irlanda 519
CN - Cina 496
SE - Svezia 365
HK - Hong Kong 240
VN - Vietnam 157
IT - Italia 143
FR - Francia 115
FI - Finlandia 82
DE - Germania 60
PL - Polonia 60
IN - India 56
UA - Ucraina 46
AR - Argentina 38
GB - Regno Unito 36
BD - Bangladesh 24
CI - Costa d'Avorio 21
EC - Ecuador 20
BE - Belgio 19
IQ - Iraq 19
MX - Messico 19
TR - Turchia 17
CO - Colombia 16
CA - Canada 15
VE - Venezuela 13
ZA - Sudafrica 12
CZ - Repubblica Ceca 11
PK - Pakistan 11
ID - Indonesia 8
PY - Paraguay 8
UZ - Uzbekistan 8
AT - Austria 7
AZ - Azerbaigian 7
MA - Marocco 7
CL - Cile 6
PH - Filippine 6
TN - Tunisia 6
DO - Repubblica Dominicana 5
DZ - Algeria 5
JP - Giappone 5
KE - Kenya 5
NP - Nepal 5
ES - Italia 4
LK - Sri Lanka 4
LT - Lituania 4
NI - Nicaragua 4
PE - Perù 4
AE - Emirati Arabi Uniti 3
EG - Egitto 3
IL - Israele 3
JM - Giamaica 3
JO - Giordania 3
KZ - Kazakistan 3
MY - Malesia 3
NL - Olanda 3
OM - Oman 3
PS - Palestinian Territory 3
RO - Romania 3
SA - Arabia Saudita 3
SN - Senegal 3
UY - Uruguay 3
BG - Bulgaria 2
BH - Bahrain 2
BO - Bolivia 2
CG - Congo 2
EU - Europa 2
GR - Grecia 2
HN - Honduras 2
HU - Ungheria 2
LB - Libano 2
PT - Portogallo 2
RS - Serbia 2
TH - Thailandia 2
TM - Turkmenistan 2
TW - Taiwan 2
AU - Australia 1
BA - Bosnia-Erzegovina 1
BB - Barbados 1
BJ - Benin 1
BY - Bielorussia 1
GY - Guiana 1
HR - Croazia 1
IR - Iran 1
KG - Kirghizistan 1
KH - Cambogia 1
LA - Repubblica Popolare Democratica del Laos 1
MD - Moldavia 1
MK - Macedonia 1
ML - Mali 1
NA - Namibia 1
NG - Nigeria 1
NO - Norvegia 1
PA - Panama 1
QA - Qatar 1
SV - El Salvador 1
TT - Trinidad e Tobago 1
Totale 8.807
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Città #
Moscow 530
Dublin 519
Ashburn 470
Singapore 366
Chandler 334
Dallas 297
Nyköping 283
Hong Kong 239
Beijing 186
San Jose 153
Jacksonville 130
Princeton 91
The Dalles 90
Lauterbourg 81
Cambridge 79
Dearborn 75
Ann Arbor 69
Des Moines 69
Medford 66
Los Angeles 55
Warsaw 54
Ho Chi Minh City 48
Messina 43
Redondo Beach 39
São Paulo 39
Buffalo 37
Dong Ket 36
Pune 32
San Mateo 31
Boardman 27
Wilmington 25
Catania 24
Hanoi 24
Guangzhou 22
Tianjin 22
Abidjan 21
Munich 20
Shenyang 19
Jinan 18
Santa Clara 18
Brussels 17
Council Bluffs 13
Houston 13
New York 13
Rio de Janeiro 13
Nanjing 11
Belo Horizonte 10
Brooklyn 10
Casamassima 10
Haikou 10
Turku 10
Baghdad 9
Brasília 9
Hebei 9
Orem 9
Shanghai 9
Ningbo 8
Shenzhen 8
Baku 7
Brno 7
Chicago 7
Goiânia 7
Porto Alegre 7
Santo André 7
Betim 6
Chennai 6
Denver 6
Dhaka 6
Haiphong 6
Hillsboro 6
Istanbul 6
Johannesburg 6
London 6
Nanchang 6
Quito 6
Salvador 6
Tashkent 6
Woodbridge 6
Zhengzhou 6
Campinas 5
Curitiba 5
Fortaleza 5
Frankfurt am Main 5
Jiaxing 5
Mumbai 5
Nairobi 5
Recife 5
Swindon 5
Treviglio 5
Alvorada 4
Ankara 4
Atlanta 4
Bauru 4
Cabo Frio 4
Carapicuíba 4
Changsha 4
Charlotte 4
Conselheiro Lafaiete 4
Contagem 4
Da Nang 4
Totale 5.198
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Nome #
Amperometric Biosensor and Front-End Electronics for Remote Glucose Monitoring by Crosslinked PEDOT-Glucose Oxidase 206
A new approach to DC removal in high gain, low noise voltage amplifiers 171
A new technique for extracting the MOSFET threshold voltage using noise measurements 170
A simple and effective testbench for quartz tuning fork characterization and sensing applications 166
A differential-input, differential-output preamplifier topology for the design of ultra-low noise voltage amplifiers 165
Accurate QTF sensing approach by means of narrow band spectral estimation 165
1/f Noise in drain and gate current of MOSFETs with high-k gate stacks 160
A new correlation method for high sensitivity current noise measurements. 153
Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level 148
A model for MOS gate stack quality evaluation based on the gate current 1/f noise 144
A novel ultra sensitive method for voltage noise measurements 142
A programmable bias current compensation approach in current noise measurement applications 141
A Backscattering Model Incorporating the Effective Carrier Temperature in Nano‑MOSFET 140
A very low noise, high accuracy, programmable voltage source for low frequency noise measurements 138
A procedure for extracting 1/f noise from random telegraph signals 138
Design and Realization of High-Accuracy Static Analog Memories (SAMs) Using Low-Cost DA Converters 136
QLSA: A Software Library for Spectral Estimation in Low-Frequency Noise Measurement Applications 136
Ultraflexible Tactile Piezoelectric Sensor Based on Low-Temperature Polycrystalline Silicon Thin-Film Transistor Technology 134
Evidence of Correlated Mobility Fluctuations in p-Type Organic Thin-Film Transistors 133
An algorithm for separating multilevel random telegraph signal from 1f noise 129
Low-frequency spectral estimation (f<1 Hz) employing PC soundcards 129
A PC based platform for accurate quartz tuning fork characterization and sensing applications 127
A microscopically accurate model of partially ballistic nanoMOSFETs in saturation based on channel backscattering 126
Investigation of Gate Direct-Current and Fluctuations in Organic p-Type Thin-Film Transistors 123
A Two-Channel DFT Spectrum Analyzer for Fluctuation Enhanced Sensing Based on a PC Audio Board 119
Low frequency noise measurements in p-type Metal-Base Vertical Organic Transistors 117
High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors 112
Low frequency noise measurements as an early indicator of degradation for devices on plastic substrates subjected to mechanical stress 106
Dedicated instrumentation for single-electron effects detection in Si nanocrystal memories 105
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures 103
Design and realization of high accuracy SAM (static analog memories) using low cost DA converters 101
A Simple, Portable, Two Channels Correlation Spectrum Analyzer for Low Frequency Noise Measurements 100
Correlated Mobility Fluctuations and Contact Effects in p-Type Organic Thin-Film Transistors 100
Long term stability estimation of DC electrical source from low frequency noise measurements 99
Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics 98
Ultra-low-noise large-bandwidth transimpedance amplifier 98
Configurable low noise amplifier for voltage noise measurements 98
Quasi-logarithmic frequency resolution approach in DFT based spectral estimation 98
Experimental extraction of barrier lowering and backscattering in saturated short-channel MOSFETs 95
Programmable, very low noise current source 93
Integrated method for impedance and low frequency noise measurements 93
Variability of the drain current in junctionless nanotransistors induced by random dopant fluctuation 90
Low-frequency (1/f) noise behavior of locally stressed HfO2/TiN gate-stack pMOSFETs 86
Dedicated instrumentation for high sensitivity, low frequency noise measurement systems 86
Noise analysis in advanced memory devices 84
Applications of integrated solar cells in low noise instrumentation 83
Gate bias system for OTFT electrical characterisation and low-frequency noise measurements 83
Junction engineering of 1T-DRAMs 83
Low Frequency Noise in DNTT/Cytop™ Based Organic Thin Film Transistors 82
Two-channel amplifier for high-sensitivity voltage noise measurements 82
Bipolar mode Operation and scalability of double-gate capacitorless 1T-DRAM cells 79
Single JFET front-end amplifier for low frequency noise measurements with cross correlation-based gain calibration 79
Investigation on the Conduction Mechanisms in Metal-Base Vertical Organic Transistors by DC and LF-Noise Measurements 79
Detection and classification of single-electron jumps in Si nanocrystal memories 77
Barrier lowering and backscattering extraction in short-channel MOSFETs 77
Estimation Errors in 1/fγ noise spectra when employing DFT spectrum analyzers 76
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique 76
Full model and characterization of noise in operational amplifier 75
Investigation on junctionless floating body DRAMs including Trap Assisted Tunneling 75
Impact of Interface Traps in Floating-Gate Memory Based on Monolayer MoS2 72
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks 72
Three-channel amplifier for high-sensitivity voltage noise measurements 72
Modeling the gate current 1/f noise and its application to advanced CMOS devices 71
Understanding and optimization of hot-carrier reliability in Germanium-on-Silicon pMOSFETs 71
Four channels cross correlation method for high sensitivity current noise measurements 70
Electrical instability in short channel organic thin-film transistors induced by lucky-polaron mechanism 70
Ultrasensitive method for current noise measurements 69
Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies 67
Low-Power Artificial Neural Network Perceptron Based on Monolayer MoS2 66
Low-frequency (1/f) noise behavior of locally stressed HfO2/ TiN gate-stack pMOSFETs 66
Floating body dram with body raised and source/drain separation 66
Portable Knee Health Monitoring System by Impedance Spectroscopy Based on Audio-Board 65
Modeling of nanoscale devices with carriers obeying a three-dimensional density of states 65
Preamplifier topology for fluctuation enhanced sensing 65
Multi Channel Amplifier Topologies for High-Sensitivity and Reduced Measurement Time in Voltage Noise Measurements 61
Performance and reliability of strained-silicon nMOSFETs with SiN cap layer 61
Physical insights of body effect and charge degradation in floating-body DRAMs 59
Impact of electrode composition and processing on the low-frequency noise in SrTiO3 MIM capacitors 59
On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low-frequency noise measurements 57
Enhanced sensitivity cross-correlation method for voltage noise measurements 56
Cross-correlation-based trans-impedance amplifier for current noise measurements 56
Time-dependent analysis of low VDD program operation in double-gate SONOS memories by full-band Monte Carlo simulation 55
Study of warm-electron injection in double-gate SONOS by full-band Monte Carlo simulation 55
Instrumentation design for gate and drain low frequency noise measurements 54
Large bandwidth op-amp based white noise current source 54
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics 53
On the impact of defects close to the gate electrode on the low-frequency 1/f noise 52
Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs 50
Does strain engineering impact the gate stack quality and reliability? 49
Criticisms on and comparison of experimental channel backscattering extraction methods 49
Ultrasensitive low noise voltage amplifier for spectral analysis 47
On the dc and noise properties of the gate current in epitaxial Ge p -channel metal oxide semiconductor field effect transistors with TiNTaNHf O2 Si O2 gate stack 47
Instrumentation design for cross-correlation measurements between gate and drain low frequency noise in MOSFETs 42
Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors 41
Impact strain engineering on gate stack quality and reliability 40
Portable and highly versatile impedance meter for very low frequency measurements 36
Modeling the diffusion and depletion capacitances of a silicon pn diode in forward bias with impedance spectroscopy 21
null 15
From Structure to Performance: The Critical Role of DNTT Morphology in Organic TFTs 14
null 11
Totale 8.928
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Categoria #
all - tutte 33.735
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 33.735
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202147 0 0 0 0 0 0 0 0 0 0 0 47
2021/2022462 3 25 12 39 19 3 16 25 11 10 117 182
2022/20231.351 123 101 81 108 69 127 11 77 620 4 26 4
2023/2024324 31 37 27 92 20 57 1 16 6 2 6 29
2024/20251.510 24 11 14 57 111 6 40 305 453 99 107 283
2025/20264.214 171 303 334 360 304 924 469 509 479 169 128 64
Totale 8.948