IRIS
GIUSI, Gino
 Distribuzione geografica
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Continente #
NA - Nord America 1.520
EU - Europa 1.222
AS - Asia 367
Continente sconosciuto - Info sul continente non disponibili 2
OC - Oceania 1
Totale 3.112
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Nazione #
US - Stati Uniti d'America 1.520
IE - Irlanda 519
SE - Svezia 361
CN - Cina 260
IT - Italia 108
FI - Finlandia 70
PL - Polonia 55
VN - Vietnam 37
SG - Singapore 34
UA - Ucraina 32
IN - India 31
DE - Germania 22
BE - Belgio 19
GB - Regno Unito 16
RU - Federazione Russa 8
CZ - Repubblica Ceca 7
HK - Hong Kong 3
EU - Europa 2
TW - Taiwan 2
AT - Austria 1
AU - Australia 1
ES - Italia 1
NL - Olanda 1
RO - Romania 1
RS - Serbia 1
Totale 3.112
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Città #
Dublin 519
Chandler 334
Nyköping 283
Ashburn 138
Beijing 136
Jacksonville 128
Princeton 91
Cambridge 79
Dearborn 75
Ann Arbor 69
Des Moines 67
Medford 66
Warsaw 51
Dong Ket 36
Messina 34
Pune 31
San Mateo 31
Boardman 27
Wilmington 25
Catania 23
Singapore 20
Shenyang 19
Jinan 18
Brussels 17
Nanjing 11
Casamassima 10
Haikou 10
Houston 10
Hebei 9
Ningbo 8
Brno 7
Tianjin 7
Nanchang 6
Woodbridge 6
Zhengzhou 6
Jiaxing 5
Swindon 5
Treviglio 5
Falls Church 4
Taizhou 4
Guangzhou 3
Hanover 3
Lanzhou 3
Norwalk 3
Swidnica 3
Brescia 2
Changsha 2
Fairfield 2
Hangzhou 2
Hefei 2
Heverlee 2
Hong Kong 2
Kleinheubach 2
Lappeenranta 2
London 2
Milan 2
Monza 2
New York 2
Palermo 2
Pescara 2
St Petersburg 2
Taipei 2
Amsterdam 1
Andover 1
Belgrade 1
Berkeley 1
Birmingham 1
Brooklyn 1
Cascina 1
Centrale 1
Fuzhou 1
Hanoi 1
Kunming 1
Kyiv 1
Legionowo 1
Neubiberg 1
Novokuznetsk 1
Palm Coast 1
Pietraperzia 1
Pinneberg 1
Pozzo Di Gotto 1
Prineville 1
Redmond 1
Redwood City 1
Saint Louis 1
Saint Petersburg 1
Seattle 1
Shanghai 1
Shaoxing 1
Summerfield 1
Taiyuan 1
Urbino 1
Viareggio 1
Vienna 1
Washington 1
Totale 2.512
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Nome #
Amperometric Biosensor and Front-End Electronics for Remote Glucose Monitoring by Crosslinked PEDOT-Glucose Oxidase 74
1/f Noise in drain and gate current of MOSFETs with high-k gate stacks 68
A new technique for extracting the MOSFET threshold voltage using noise measurements 68
Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level 66
A new approach to DC removal in high gain, low noise voltage amplifiers 64
Investigation of Gate Direct-Current and Fluctuations in Organic p-Type Thin-Film Transistors 63
A differential-input, differential-output preamplifier topology for the design of ultra-low noise voltage amplifiers 62
Low frequency noise measurements as an early indicator of degradation for devices on plastic substrates subjected to mechanical stress 61
A new correlation method for high sensitivity current noise measurements. 61
Low-frequency spectral estimation (f<1 Hz) employing PC soundcards 59
A simple and effective testbench for quartz tuning fork characterization and sensing applications 58
High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors 58
Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics 56
Design and Realization of High-Accuracy Static Analog Memories (SAMs) Using Low-Cost DA Converters 54
Correlated Mobility Fluctuations and Contact Effects in p-Type Organic Thin-Film Transistors 54
Ultraflexible Tactile Piezoelectric Sensor Based on Low-Temperature Polycrystalline Silicon Thin-Film Transistor Technology 54
A procedure for extracting 1/f noise from random telegraph signals 50
Design and realization of high accuracy SAM (static analog memories) using low cost DA converters 50
Evidence of Correlated Mobility Fluctuations in p-Type Organic Thin-Film Transistors 49
Experimental extraction of barrier lowering and backscattering in saturated short-channel MOSFETs 48
Configurable low noise amplifier for voltage noise measurements 48
Low frequency noise measurements in p-type Metal-Base Vertical Organic Transistors 48
Dedicated instrumentation for high sensitivity, low frequency noise measurement systems 47
Long term stability estimation of DC electrical source from low frequency noise measurements 47
QLSA: A Software Library for Spectral Estimation in Low-Frequency Noise Measurement Applications 47
Accurate QTF sensing approach by means of narrow band spectral estimation 45
A Backscattering Model Incorporating the Effective Carrier Temperature in Nano‑MOSFET 44
A model for MOS gate stack quality evaluation based on the gate current 1/f noise 44
An algorithm for separating multilevel random telegraph signal from 1f noise 43
A programmable bias current compensation approach in current noise measurement applications 43
A very low noise, high accuracy, programmable voltage source for low frequency noise measurements 42
Quasi-logarithmic frequency resolution approach in DFT based spectral estimation 42
Applications of integrated solar cells in low noise instrumentation 41
Investigation on junctionless floating body DRAMs including Trap Assisted Tunneling 41
Barrier lowering and backscattering extraction in short-channel MOSFETs 39
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures 39
Programmable, very low noise current source 38
Investigation on the Conduction Mechanisms in Metal-Base Vertical Organic Transistors by DC and LF-Noise Measurements 38
Low-frequency (1/f) noise behavior of locally stressed HfO2/TiN gate-stack pMOSFETs 37
Integrated method for impedance and low frequency noise measurements 37
Ultrasensitive method for current noise measurements 35
Bipolar mode Operation and scalability of double-gate capacitorless 1T-DRAM cells 35
A novel ultra sensitive method for voltage noise measurements 35
Noise analysis in advanced memory devices 35
Junction engineering of 1T-DRAMs 34
Portable Knee Health Monitoring System by Impedance Spectroscopy Based on Audio-Board 32
Multi Channel Amplifier Topologies for High-Sensitivity and Reduced Measurement Time in Voltage Noise Measurements 32
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique 32
Ultra-low-noise large-bandwidth transimpedance amplifier 32
Four channels cross correlation method for high sensitivity current noise measurements 32
Floating body dram with body raised and source/drain separation 32
Two-channel amplifier for high-sensitivity voltage noise measurements 31
Variability of the drain current in junctionless nanotransistors induced by random dopant fluctuation 28
Dedicated instrumentation for single-electron effects detection in Si nanocrystal memories 27
Electrical instability in short channel organic thin-film transistors induced by lucky-polaron mechanism 27
Three-channel amplifier for high-sensitivity voltage noise measurements 26
Gate bias system for OTFT electrical characterisation and low-frequency noise measurements 26
A microscopically accurate model of partially ballistic nanoMOSFETs in saturation based on channel backscattering 23
Performance and reliability of strained-silicon nMOSFETs with SiN cap layer 23
A PC based platform for accurate quartz tuning fork characterization and sensing applications 23
Modeling of nanoscale devices with carriers obeying a three-dimensional density of states 22
Criticisms on and comparison of experimental channel backscattering extraction methods 22
Impact of electrode composition and processing on the low-frequency noise in SrTiO3 MIM capacitors 22
Estimation Errors in 1/fγ noise spectra when employing DFT spectrum analyzers 21
Understanding and optimization of hot-carrier reliability in Germanium-on-Silicon pMOSFETs 21
Time-dependent analysis of low VDD program operation in double-gate SONOS memories by full-band Monte Carlo simulation 21
Detection and classification of single-electron jumps in Si nanocrystal memories 21
Preamplifier topology for fluctuation enhanced sensing 21
Single JFET front-end amplifier for low frequency noise measurements with cross correlation-based gain calibration 21
Low-frequency (1/f) noise behavior of locally stressed HfO2/ TiN gate-stack pMOSFETs 20
Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs 20
Enhanced sensitivity cross-correlation method for voltage noise measurements 19
Full model and characterization of noise in operational amplifier 19
Study of warm-electron injection in double-gate SONOS by full-band Monte Carlo simulation 19
Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies 18
Does strain engineering impact the gate stack quality and reliability? 18
On the impact of defects close to the gate electrode on the low-frequency 1/f noise 18
Cross-correlation-based trans-impedance amplifier for current noise measurements 18
Large bandwidth op-amp based white noise current source 18
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics 18
Instrumentation design for gate and drain low frequency noise measurements 17
Ultrasensitive low noise voltage amplifier for spectral analysis 17
On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low-frequency noise measurements 17
Physical insights of body effect and charge degradation in floating-body DRAMs 16
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks 16
Instrumentation design for cross-correlation measurements between gate and drain low frequency noise in MOSFETs 16
On the dc and noise properties of the gate current in epitaxial Ge p -channel metal oxide semiconductor field effect transistors with TiNTaNHf O2 Si O2 gate stack 16
Modeling the gate current 1/f noise and its application to advanced CMOS devices 15
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Impact strain engineering on gate stack quality and reliability 13
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Portable and highly versatile impedance meter for very low frequency measurements 10
A Two-Channel DFT Spectrum Analyzer for Fluctuation Enhanced Sensing Based on a PC Audio Board 10
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Impact of Interface Traps in Floating-Gate Memory Based on Monolayer MoS2 6
Low-Power Artificial Neural Network Perceptron Based on Monolayer MoS2 6
Totale 3.235
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Categoria #
all - tutte 14.405
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 14.405
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020346 18 9 4 12 3 73 26 23 5 78 75 20
2020/2021410 23 11 89 13 87 10 12 12 61 35 10 47
2021/2022462 3 25 12 39 19 3 16 25 11 10 117 182
2022/20231.351 123 101 81 108 69 127 11 77 620 4 26 4
2023/2024322 31 37 27 92 20 57 1 15 6 2 5 29
2024/202513 13 0 0 0 0 0 0 0 0 0 0 0
Totale 3.235